10 New Na + Superionic Conductor Narpsio Glass-Ceramics
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wavelength used to collect the data, while peak intensity depends upon the types of
atoms present and their positions.
As a result of the enormous range of different structures which materials adopt,
nearly all crystalline solids have a unique powder X-ray diffraction pattern in terms
of the positions of the observed reflections and the peak intensities. In mixtures of
compounds, each crystalline phase present will contribute to the powder diffraction
pattern in its own unique set of lines. The relative intensity of line sets from mixtures
will depend on the amount present and the ability of a structure to scatter X-rays.
The crystalline phases of glass-ceramic specimens were identified by XRD. The
lattice parameters of the N5-type hexagonal unit cell were calculated by a leastsquares method using the XRD peaks of (054), (044), (134), (440), and (024).
10.2.2.3 Scanning Electron Microscope and Transmission Electron
Microscope
A recent and very useful research tool is a scanning electron microscope (SEM).
The surface of a specimen to be examined is scanned with an electron beam, and
the reflected (or backscattered) electron beam is collected and then displayed at the
same scanning speed on a cathode ray tube (CRT). The image on the screen that may
be photographed represents the surface features of the specimen. The surface may
or may not be polished and etched but must be electrically conductive. A very thin
metal surface coating must be applied to the nonconductive material. Magnifications
in the range of 10 times to 50,000 times are also possible, and there is also a very
great depth of field. Ancillary equipment allows qualitative and semiquantitative
analysis of the elemental composition of highly localized surface areas.
The image seen with a transmission electron microscope (TEM) is formed by an
electron beam passing through the specimen. Details of the internal microstructural
features are accessible for observation. The contrasts in the image are caused by the
differences in beam scattering or diffraction occurring between the various elements
of the microstructure or defect. Since the solid materials are highly absorptive to the
electron beams, the specimen to be examined must be prepared in the form of a
very thin foil. This allows a significant fraction of the incident beam to penetrate
the specimen. The transmitted beam is projected onto a fluorescent screen or a
photographic film so that the image can be seen.
Glass-ceramics of Y 3+ -containing Narpsio were subjected to SEM and TEM for
microstructural analysis. Electron diffraction and compositional analyses were also
performed to characterize the structure of the grain boundary.
10.2.2.4 Arrhenius Plot and Kissinger Plot
In chemical kinetics, an Arrhenius plot displays the logarithm of a reaction rate
constant (ln k, ordinate axis) plotted against inverse temperature (1/T, abscissa
axis). Arrhenius plots are often used to analyze the effect of temperature on the
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wavelength used to collect the data, while peak intensity depends upon the types of
atoms present and their positions.
As a result of the enormous range of different structures which materials adopt,
nearly all crystalline solids have a unique powder X-ray diffraction pattern in terms
of the positions of the observed reflections and the peak intensities. In mixtures of
compounds, each crystalline phase present will contribute to the powder diffraction
pattern in its own unique set of lines. The relative intensity of line sets from mixtures
will depend on the amount present and the ability of a structure to scatter X-rays.
The crystalline phases of glass-ceramic specimens were identified by XRD. The
lattice parameters of the N5-type hexagonal unit cell were calculated by a leastsquares method using the XRD peaks of (054), (044), (134), (440), and (024).
10.2.2.3 Scanning Electron Microscope and Transmission Electron
Microscope
A recent and very useful research tool is a scanning electron microscope (SEM).
The surface of a specimen to be examined is scanned with an electron beam, and
the reflected (or backscattered) electron beam is collected and then displayed at the
same scanning speed on a cathode ray tube (CRT). The image on the screen that may
be photographed represents the surface features of the specimen. The surface may
or may not be polished and etched but must be electrically conductive. A very thin
metal surface coating must be applied to the nonconductive material. Magnifications
in the range of 10 times to 50,000 times are also possible, and there is also a very
great depth of field. Ancillary equipment allows qualitative and semiquantitative
analysis of the elemental composition of highly localized surface areas.
The image seen with a transmission electron microscope (TEM) is formed by an
electron beam passing through the specimen. Details of the internal microstructural
features are accessible for observation. The contrasts in the image are caused by the
differences in beam scattering or diffraction occurring between the various elements
of the microstructure or defect. Since the solid materials are highly absorptive to the
electron beams, the specimen to be examined must be prepared in the form of a
very thin foil. This allows a significant fraction of the incident beam to penetrate
the specimen. The transmitted beam is projected onto a fluorescent screen or a
photographic film so that the image can be seen.
Glass-ceramics of Y 3+ -containing Narpsio were subjected to SEM and TEM for
microstructural analysis. Electron diffraction and compositional analyses were also
performed to characterize the structure of the grain boundary.
10.2.2.4 Arrhenius Plot and Kissinger Plot
In chemical kinetics, an Arrhenius plot displays the logarithm of a reaction rate
constant (ln k, ordinate axis) plotted against inverse temperature (1/T, abscissa
axis). Arrhenius plots are often used to analyze the effect of temperature on the