402
Y. Liu et al.
References
1. F.W. Sexton, D.M. Fleetwood, M.R. Shaneyfelt, P.E. Dodd, G.L. Hash, Single event gate rupture
on thin gate oxides. IEEE Trans. Nucl. Sci. 44(6), 2345–2352 (1997)
2. J. Clerk Maxwell, A Treatise on Electricity and Magnetism, 3rd edn., vol. 2 (Oxford: Clarendon,
1892), pp 68–73
3. I.S. Jacobs, C.P. Bean, Fine particles, thin films and exchange anisotropy, in Magnetism, vol.
III, ed. by G.T. Rado, H. Suhl (Academic, New York, 1963), pp. 271–350
4. K. Elissa, Title of paper, unpublished
5. R. Nicole, Title of paper with only first word capitalized. J. Name Stand. Abbrev., submitted for
publication
Y. Liu et al.
References
1. F.W. Sexton, D.M. Fleetwood, M.R. Shaneyfelt, P.E. Dodd, G.L. Hash, Single event gate rupture
on thin gate oxides. IEEE Trans. Nucl. Sci. 44(6), 2345–2352 (1997)
2. J. Clerk Maxwell, A Treatise on Electricity and Magnetism, 3rd edn., vol. 2 (Oxford: Clarendon,
1892), pp 68–73
3. I.S. Jacobs, C.P. Bean, Fine particles, thin films and exchange anisotropy, in Magnetism, vol.
III, ed. by G.T. Rado, H. Suhl (Academic, New York, 1963), pp. 271–350
4. K. Elissa, Title of paper, unpublished
5. R. Nicole, Title of paper with only first word capitalized. J. Name Stand. Abbrev., submitted for
publication