ellipsometer, 275–278
overview, 265–266
thickness of films, optical parameters del (Δ) and
psi (Y), 273–274
nanostructures, 308–329
ellipsometry, 308–311
NSOM, 323–329
overview, 308
scanning probe methods, 311–317
TEM, 317–323
nonlinear spectroscopic methods, 294–307
examples, 297–298
overview, 294–300
SFG, 304–307
SHG, 300–304
overview, 255
QCM, 259–265
defined, 259
detection limits, 262
dissipation monitoring (QCM-D), 263–265
examples, 262
overview, 259
piezoelectric effect, 259–261
principles, 261–262
surface-sensitive spectroscopic methods, 290–294
ATR-FTIR spectroscopy, 290–292
RAIRS, 292
SERS, 293–294
tensiometry, 255–259
basic setup, 255, 256f
density from force acting on plate, 257–259
example, 257
Wilhelmy plate method, 256, 257f
thickness and refactive index, techniques for
measuring, 278–290
DPI, 284–290
reflection phenomena at interfaces,
278–280
SPR, 280–284
Surface-charging mechanism, 157–159
Surface-enhanced Raman spectroscopy (SERS),
293–294
Surface excess, determination of, 246–250
Surface nanoscience, 217–250
adsorption phenomena, SAMs, 230–241
adsorption isotherms, 235–241
example, 238–239
overview, 230–235
contact angles and wetting phenomena, 223–225
energy of solids and liquids, 218–219
examples, 221–222
free energy of adsorbed monolayers,
219–223
overview, 217
superhydrophobic surfaces, 225–230
surfactant chemistry, 241–250
example, 249–250
micelle and microemulsion formation, 243–246
overview, 241–243
surface excess, determination of, 246–250
Surface plasma waves, 280
492 Index