integrated rate laws, 71–73
laws and reaction orders, 65–70
overview, 63–65
reversible reactions, 70, 71f
Rayleigh ratio
for colloidal solution, 206
defined, 206
Rayleigh scattering, 196, 202–203
Reaction orders, rate laws and, 65–70
Reaction quotient, defined, 50
Reaction(s)
bimolecular step, 78–79
mechanism, 78–79
molecularity, 78–79, 79t
rates, theoretical models for, 74–79
catalysis, 77–79
collision theory, 75–77
temperature dependence of rate constant,
74–75
reversible, 70, 71f
Reduced mass, defined, 123, 198
Refractive index, techniques for measuring,
278–290
DPI, 284–290
reflection phenomena at interfaces, 278–280
SPR, 280–284
Reference waveguide, 286, 287
Reflected beam, defined, 269
Reflection absorption IR spectroscopy (RAIRS), 292
Reflection-collection mode, NSOM probe, 325, 326f
Reflection mode, NSOM probe, 325, 326f
Reflection phenomena, at interfaces, 278–280
evanescent waves, 279–280
TIR, 278–279
Refractive index (n), 270–271, 271f, 295
complex, 186–187
dual-polarized interferometry, 284–290
application, 289–290
principles of, 287–290, 289f
transverse electric (TE) mode, 287–288
transverse magnetic (TM) polarized mode,
287–288
waveguide basics, 284–285, 285f
waveguide interferometry, effective refractive
index and, 285–287, 286f
effective, 285–287
of medium, 147
randomly dispersed nanospherical micelles,
205–206
reflection phenomena at interfaces, 278–280
evanescent waves, 279–280
total internal reflection, 278–279
surface plasmon resonance, 280–284
instrument setup, 282–284, 282f
principles, 280–282, 281f
Relative temperature fluctuation, nanosystems and, 22
Relaxation process, 188
Repulsion, overlap, 149–152
Resolution, for imaging ellipsometer, 310–311, 310f
Resonant energy transfer, 353
Index 487
laws and reaction orders, 65–70
overview, 63–65
reversible reactions, 70, 71f
Rayleigh ratio
for colloidal solution, 206
defined, 206
Rayleigh scattering, 196, 202–203
Reaction orders, rate laws and, 65–70
Reaction quotient, defined, 50
Reaction(s)
bimolecular step, 78–79
mechanism, 78–79
molecularity, 78–79, 79t
rates, theoretical models for, 74–79
catalysis, 77–79
collision theory, 75–77
temperature dependence of rate constant,
74–75
reversible, 70, 71f
Reduced mass, defined, 123, 198
Refractive index, techniques for measuring,
278–290
DPI, 284–290
reflection phenomena at interfaces, 278–280
SPR, 280–284
Reference waveguide, 286, 287
Reflected beam, defined, 269
Reflection absorption IR spectroscopy (RAIRS), 292
Reflection-collection mode, NSOM probe, 325, 326f
Reflection mode, NSOM probe, 325, 326f
Reflection phenomena, at interfaces, 278–280
evanescent waves, 279–280
TIR, 278–279
Refractive index (n), 270–271, 271f, 295
complex, 186–187
dual-polarized interferometry, 284–290
application, 289–290
principles of, 287–290, 289f
transverse electric (TE) mode, 287–288
transverse magnetic (TM) polarized mode,
287–288
waveguide basics, 284–285, 285f
waveguide interferometry, effective refractive
index and, 285–287, 286f
effective, 285–287
of medium, 147
randomly dispersed nanospherical micelles,
205–206
reflection phenomena at interfaces, 278–280
evanescent waves, 279–280
total internal reflection, 278–279
surface plasmon resonance, 280–284
instrument setup, 282–284, 282f
principles, 280–282, 281f
Relative temperature fluctuation, nanosystems and, 22
Relaxation process, 188
Repulsion, overlap, 149–152
Resolution, for imaging ellipsometer, 310–311, 310f
Resonant energy transfer, 353
Index 487
