Chapter 7
Fundamentals of Surface
Nanoscience
217
7.1 FUNDAMENTALS OF SURFACE SCIENCE 218
7.1.1 Surface energy of solids
and liquids
218
7.1.2 Surface free energy of adsorbed
monolayers
219
7.1.3 Contact angles and wetting
phenomena
223
7.1.4 Nanomaterials and
superhydrophobic surfaces
225
7.2 ADSORPTION PHENOMENA:
SELF-ASSEMBLED MONOLAYERS
230
7.2.1 Simple adsorption isotherms
235
7.2.2 Other useful adsorption
isotherms
240
7.3 SURFACTANT CHEMISTRY
241
7.3.1 Micelle and microemulsion
formation
243
7.3.2 The determination of surface
excess: The CMC and the
cross-sectional area
per molecule
246
END OF CHAPTER QUESTIONS
250
REFERENCES AND RECOMMENDED READING 254
Chapter 8
Surface Characterization
and Imaging Methods
255
8.1 SURFACE TENSIOMETRY: THE SURFACE
TENSIOMETER
255
8.2 QUARTZ CRYSTAL MICROBALANCE
259
8.2.1 The piezoelectric effect
259
8.2.2 QCM principles
261
8.2.3 QCM and dissipation (D)
263
8.2.4 Modern QCM-D setup
264
8.3 ELLIPSOMETRY
265
8.3.1 Basic principles of
electromagnetic theory
and polarized light
266
8.3.2 Basic principles of ellipsometry 270
8.3.3 Obtaining the thickness of films:
Optical parameters Del (Δ)
and Psi (ψ)
273
8.3.4 The ellipsometer
275
8.4 OTHER TECHNIQUES FOR MEASURING
THICKNESS AND REFRACTIVE INDEX
278
8.4.1 Reflection phenomena
at interfaces
278
8.4.2 Surface plasmon resonance
280
8.4.3 Dual polarization interferometry 284
8.5 SURFACE-SENSITIVE SPECTROSCOPIC
METHODS
290
8.5.1 Attenuated total reflection
IR spectroscopy
290
8.5.2 Reflection absorption
IR spectroscopy
292
8.5.3 Surface-enhanced Raman
spectroscopy
293
8.6 NONLINEAR SPECTROSCOPIC METHODS 294
8.6.1 An introduction to nonlinear
optics
294
8.6.2 Second-harmonic generation
300
8.6.3 Sum-frequency generation
spectroscopy
304
8.7 IMAGING NANOSTRUCTURES
308
8.7.1 Imaging ellipsometry
308
8.7.2 Scanning probe methods
311
8.7.3 Transmission electron
microscopy
317
8.7.4 Near-field scanning optical
microscopy
323
END OF CHAPTER QUESTIONS
329
REFERENCES AND RECOMMENDED READING 332
xii
Detailed Contents
Fundamentals of Surface
Nanoscience
217
7.1 FUNDAMENTALS OF SURFACE SCIENCE 218
7.1.1 Surface energy of solids
and liquids
218
7.1.2 Surface free energy of adsorbed
monolayers
219
7.1.3 Contact angles and wetting
phenomena
223
7.1.4 Nanomaterials and
superhydrophobic surfaces
225
7.2 ADSORPTION PHENOMENA:
SELF-ASSEMBLED MONOLAYERS
230
7.2.1 Simple adsorption isotherms
235
7.2.2 Other useful adsorption
isotherms
240
7.3 SURFACTANT CHEMISTRY
241
7.3.1 Micelle and microemulsion
formation
243
7.3.2 The determination of surface
excess: The CMC and the
cross-sectional area
per molecule
246
END OF CHAPTER QUESTIONS
250
REFERENCES AND RECOMMENDED READING 254
Chapter 8
Surface Characterization
and Imaging Methods
255
8.1 SURFACE TENSIOMETRY: THE SURFACE
TENSIOMETER
255
8.2 QUARTZ CRYSTAL MICROBALANCE
259
8.2.1 The piezoelectric effect
259
8.2.2 QCM principles
261
8.2.3 QCM and dissipation (D)
263
8.2.4 Modern QCM-D setup
264
8.3 ELLIPSOMETRY
265
8.3.1 Basic principles of
electromagnetic theory
and polarized light
266
8.3.2 Basic principles of ellipsometry 270
8.3.3 Obtaining the thickness of films:
Optical parameters Del (Δ)
and Psi (ψ)
273
8.3.4 The ellipsometer
275
8.4 OTHER TECHNIQUES FOR MEASURING
THICKNESS AND REFRACTIVE INDEX
278
8.4.1 Reflection phenomena
at interfaces
278
8.4.2 Surface plasmon resonance
280
8.4.3 Dual polarization interferometry 284
8.5 SURFACE-SENSITIVE SPECTROSCOPIC
METHODS
290
8.5.1 Attenuated total reflection
IR spectroscopy
290
8.5.2 Reflection absorption
IR spectroscopy
292
8.5.3 Surface-enhanced Raman
spectroscopy
293
8.6 NONLINEAR SPECTROSCOPIC METHODS 294
8.6.1 An introduction to nonlinear
optics
294
8.6.2 Second-harmonic generation
300
8.6.3 Sum-frequency generation
spectroscopy
304
8.7 IMAGING NANOSTRUCTURES
308
8.7.1 Imaging ellipsometry
308
8.7.2 Scanning probe methods
311
8.7.3 Transmission electron
microscopy
317
8.7.4 Near-field scanning optical
microscopy
323
END OF CHAPTER QUESTIONS
329
REFERENCES AND RECOMMENDED READING 332
xii
Detailed Contents