3.4.
8000
6000
4000
2000
SPECTROSCOPY
65
- A
-
-
I
I
I
I
X-RAY PHOTOELECTRON SPECTROMETER
-
1400
1200
1000
800
El
X-RAY
B
I .
: ' .
-
. .
. .
. .
. .
.
.
:
' In p:
:
I - ,
-
' . !:;;Po;\ I
\
-
. . .
-
. -
, '..,
-
-7
. ._ -
I
I
I
1
I
TUBE
Figure 3.29. X-ray photoelectron spectrometer showing photons hv generated by an X-ray tube
incident on the specimen where they produce photoelectrons e- characteristic of the specimen
material, which then traverse a velocity analyzer, and are brought to focus at an electron detector
that measures their kinetic energy.
439
441
443
445
447
Binding Energy (eV)
Figure 3.30. X-ray photoelectron spectra (XPS) of nanocrystalline InP showing (a) 3 9 , , indium
signal and (b) 2p phosphorus peaks. [From 0. Yitai, in Nalwa (2000), Vol. 1, Chapter 9, p. 427.1
8000
6000
4000
2000
SPECTROSCOPY
65
- A
-
-
I
I
I
I
X-RAY PHOTOELECTRON SPECTROMETER
-
1400
1200
1000
800
El
X-RAY
B
I .
: ' .
-
. .
. .
. .
. .
.
.
:
' In p:
:
I - ,
-
' . !:;;Po;\ I
\
-
. . .
-
. -
, '..,
-
-7
. ._ -
I
I
I
1
I
TUBE
Figure 3.29. X-ray photoelectron spectrometer showing photons hv generated by an X-ray tube
incident on the specimen where they produce photoelectrons e- characteristic of the specimen
material, which then traverse a velocity analyzer, and are brought to focus at an electron detector
that measures their kinetic energy.
439
441
443
445
447
Binding Energy (eV)
Figure 3.30. X-ray photoelectron spectra (XPS) of nanocrystalline InP showing (a) 3 9 , , indium
signal and (b) 2p phosphorus peaks. [From 0. Yitai, in Nalwa (2000), Vol. 1, Chapter 9, p. 427.1