60
METHODS OF MEASURING PROPERTIES
(I)
0
c
t-0
e
5:
2
I
I
I
I
I
4000
3500
3000
2500
2000
1500
Wavenumber (cm-l)
Figure 3.23. Fourier transform infrared spectrum of silicon nitride nanopowder recorded at room
temperature under vacuum (tracing a) and after activation at 773 K (tracing b). (From G. Ramis,
G. Busca, V. Lorenzelli, M.4. Baraton, T. Merle-Mejean, and P. Quintard, in Surfaces and
lnterfaces of Ceramic Materials. L. C. Dufour et al., eds., Kluwer Academic, Dordrecht, 1989,
p. 173.)
Si-OH
triple bonded C=O
.n
a
I
Si'p"
(I)
c
o a
t-0e
5:
a
triple bonded C=O
.n
t
I
I
I
I
I
4000
3500
3000
2500
2000
1500
Wavenum ber (cm-1)
Figure 3.24. Fourier transform infrared spectrum of silicon carbonitride nanopowder recorded
after activation at 873 K (tracing a) and after subsequent heating in dry oxygen at 773 K for one
hour (tracing b). [From M.4. Baraton, in Nalwa (2000), Vol. 2, Chapter 2, p. 131; see also
M.4. Baraton, W. Chang, and B. H. Kear, J. fhys. Chem. 100, 16647 (1996).]
METHODS OF MEASURING PROPERTIES
(I)
0
c
t-0
e
5:
2
I
I
I
I
I
4000
3500
3000
2500
2000
1500
Wavenumber (cm-l)
Figure 3.23. Fourier transform infrared spectrum of silicon nitride nanopowder recorded at room
temperature under vacuum (tracing a) and after activation at 773 K (tracing b). (From G. Ramis,
G. Busca, V. Lorenzelli, M.4. Baraton, T. Merle-Mejean, and P. Quintard, in Surfaces and
lnterfaces of Ceramic Materials. L. C. Dufour et al., eds., Kluwer Academic, Dordrecht, 1989,
p. 173.)
Si-OH
triple bonded C=O
.n
a
I
Si'p"
(I)
c
o a
t-0e
5:
a
triple bonded C=O
.n
t
I
I
I
I
I
4000
3500
3000
2500
2000
1500
Wavenum ber (cm-1)
Figure 3.24. Fourier transform infrared spectrum of silicon carbonitride nanopowder recorded
after activation at 873 K (tracing a) and after subsequent heating in dry oxygen at 773 K for one
hour (tracing b). [From M.4. Baraton, in Nalwa (2000), Vol. 2, Chapter 2, p. 131; see also
M.4. Baraton, W. Chang, and B. H. Kear, J. fhys. Chem. 100, 16647 (1996).]