E1BINDEX 09/09/2010
18:13:50 Page 589
digital signal, 47
discrete time signal, 47
value, 47
Root-sum-square method, 164, 321
Rotameter, 451
turndown, 452
uncertainty, 452
Rotating vane flowmeter, 454
RTD. See Resistance temperature detector
Ruge, Arthur, 469
S
Sample, 119, 120
mean value, 130
standard deviation, 130
standard deviation of the mean, 132
variance, 130
Sample and hold circuit, 235, 279
Sampling, 42, 43, 47, 119, 130, 260, 261
rate, 42, 43, 236
theorem, 262, 263, 266
time period, 261
Sampling convolution, 47
Second-order systems, 95
Second power law, 175
Seebeck coefficient, 331
Seebeck effect, 331
Seebeck, Thomas Johann, 331
Seismic transducer, 510
Sensitivity error, 21–23, 165
Sensitivity index, 174, 175, 189
Sensor, 3, 4
Sequential perturbation, 174, 176
Sequential test, 20
Serial communication, 293, 294
Settling time, 98
determination of, 98, 99
Shaft power, 529–531
Shielding, 250
Shock measurement, 516
piezoelectric, 516
Shock tube, 393
Shunt balancing, 477
Shunt cirucuit, 285
Signal, 41
ac component, 46, 48
analog signal, 42, 43, 47, 65, 230, 234,
239, 261, 263, 290
averaging period, 284
conditioning, 4, 5, 209, 215,
230, 234, 239, 275, 285,
290, 292
dc component, 46, 47
digital, 43, 47, 239, 260, 274, 287, 303
discrete time, 42, 43, 47, 65, 260, 261,
263, 266
frequency, 25, 42, 49, 64, 69, 92, 93,
246, 252, 411
input, 41–46
magnitude or amplitude, 41
output, 41–46
sampling, 42, 261
waveform, 41–42, 106, 269
Signal classification
analog, 42
aperiodic, 43
complex periodic, 44
deterministic, 44
digital, 42
discrete time, 42–43
dynamic, 42
nondeterministic, 45
static, 44
steady periodic, 44
Simmons, Edward, 469
Single-ended connection, 290
Single-measurement uncertainty analysis,
177
Sonic nozzle, 440
discharge coefficient, 441
uncertainty, 441
Source
random limit, 171
systematic limit, 170
Span, 16
Spectrum
amplitude, 65
power, 65
Stagnation streamline, 396, 449
Standard atmosphere, 311, 377
Standard deviation, 22, 125, 130, 132
of the means, 132
Standard error of the fit, 141, 144–146,
186
Standards, 23
hierarchy, 28
primary, 23
temperature, 310
test, 30
Standarized normal variate, 126
Static calibration, 15, 84, 392
Static pressure. See Pressure, static
Static sensitivity, 16, 83
determination of, 16, 84, 110, 381,
447
Static temperature. See Temperature,
static
Steady response, 86, 88, 92, 93, 98
Steady signal, 117
Step function, 85, 97
Strain, 466
apparent, 482
axial, 467, 468, 474, 488
lateral, 467–469
Strain gauge, 469
bonded resistance, 469
bonding, 473
bridge constant, 479
circuits, 476
configurations, 483
construction, 472
dynamic response, 492
foil, 472
gauge factor, 473
gauge length, 472, 486
hysteresis, 487
load cell, 525
metallic, 470
multiple, 390
resistance, 389, 390
rosettes, 487–489
semiconductor, 475
temperature compensation, 485
transverse sensitivity, 473, 474
Strain measurement
Moire, 495
photoelastic, 493
resistance, 469
Strain optical coefficient, 494
Stress, 468
biaxial, 469
Stroboscope, 522
harmonic techniques, 523
Strouhal number, 448–450
Student’s t distribution, 131
Superposition, 12, 44, 63, 107
Systematic uncertainty. See Uncertainty,
systematic
System response, 79
frequency, 92, 98
steady, 83, 512
time, 83
transient, 86, 92, 96, 97, 402
T
Technical writing, 30, 163
Temperature, 25
absolute, 25, 312, 360
calibration, 314, 324, 337, 351
compensation, 292, 335, 482
dynamic, 363
fixed points, 311
interpolation, 25
radiative, 351
scales, 312
stagnation, 363
standards, 25, 460
static, 363, 364
thermal expansion, 4, 313, 314
thermodynamic, 25, 312
thermoelectric, 330–350
total, 363, 365
t estimator, 131, 145
Test plan. See Measurement plan
Thermal anemometer, 408, 409, 414,
415
Thermal flow meter, 455
turndown, 455
uncertainty, 455
Thermistor, 323
circuit, 324
dissipation constant, 325, 327
zero-power resistance, 325
Index 589
18:13:50 Page 589
digital signal, 47
discrete time signal, 47
value, 47
Root-sum-square method, 164, 321
Rotameter, 451
turndown, 452
uncertainty, 452
Rotating vane flowmeter, 454
RTD. See Resistance temperature detector
Ruge, Arthur, 469
S
Sample, 119, 120
mean value, 130
standard deviation, 130
standard deviation of the mean, 132
variance, 130
Sample and hold circuit, 235, 279
Sampling, 42, 43, 47, 119, 130, 260, 261
rate, 42, 43, 236
theorem, 262, 263, 266
time period, 261
Sampling convolution, 47
Second-order systems, 95
Second power law, 175
Seebeck coefficient, 331
Seebeck effect, 331
Seebeck, Thomas Johann, 331
Seismic transducer, 510
Sensitivity error, 21–23, 165
Sensitivity index, 174, 175, 189
Sensor, 3, 4
Sequential perturbation, 174, 176
Sequential test, 20
Serial communication, 293, 294
Settling time, 98
determination of, 98, 99
Shaft power, 529–531
Shielding, 250
Shock measurement, 516
piezoelectric, 516
Shock tube, 393
Shunt balancing, 477
Shunt cirucuit, 285
Signal, 41
ac component, 46, 48
analog signal, 42, 43, 47, 65, 230, 234,
239, 261, 263, 290
averaging period, 284
conditioning, 4, 5, 209, 215,
230, 234, 239, 275, 285,
290, 292
dc component, 46, 47
digital, 43, 47, 239, 260, 274, 287, 303
discrete time, 42, 43, 47, 65, 260, 261,
263, 266
frequency, 25, 42, 49, 64, 69, 92, 93,
246, 252, 411
input, 41–46
magnitude or amplitude, 41
output, 41–46
sampling, 42, 261
waveform, 41–42, 106, 269
Signal classification
analog, 42
aperiodic, 43
complex periodic, 44
deterministic, 44
digital, 42
discrete time, 42–43
dynamic, 42
nondeterministic, 45
static, 44
steady periodic, 44
Simmons, Edward, 469
Single-ended connection, 290
Single-measurement uncertainty analysis,
177
Sonic nozzle, 440
discharge coefficient, 441
uncertainty, 441
Source
random limit, 171
systematic limit, 170
Span, 16
Spectrum
amplitude, 65
power, 65
Stagnation streamline, 396, 449
Standard atmosphere, 311, 377
Standard deviation, 22, 125, 130, 132
of the means, 132
Standard error of the fit, 141, 144–146,
186
Standards, 23
hierarchy, 28
primary, 23
temperature, 310
test, 30
Standarized normal variate, 126
Static calibration, 15, 84, 392
Static pressure. See Pressure, static
Static sensitivity, 16, 83
determination of, 16, 84, 110, 381,
447
Static temperature. See Temperature,
static
Steady response, 86, 88, 92, 93, 98
Steady signal, 117
Step function, 85, 97
Strain, 466
apparent, 482
axial, 467, 468, 474, 488
lateral, 467–469
Strain gauge, 469
bonded resistance, 469
bonding, 473
bridge constant, 479
circuits, 476
configurations, 483
construction, 472
dynamic response, 492
foil, 472
gauge factor, 473
gauge length, 472, 486
hysteresis, 487
load cell, 525
metallic, 470
multiple, 390
resistance, 389, 390
rosettes, 487–489
semiconductor, 475
temperature compensation, 485
transverse sensitivity, 473, 474
Strain measurement
Moire, 495
photoelastic, 493
resistance, 469
Strain optical coefficient, 494
Stress, 468
biaxial, 469
Stroboscope, 522
harmonic techniques, 523
Strouhal number, 448–450
Student’s t distribution, 131
Superposition, 12, 44, 63, 107
Systematic uncertainty. See Uncertainty,
systematic
System response, 79
frequency, 92, 98
steady, 83, 512
time, 83
transient, 86, 92, 96, 97, 402
T
Technical writing, 30, 163
Temperature, 25
absolute, 25, 312, 360
calibration, 314, 324, 337, 351
compensation, 292, 335, 482
dynamic, 363
fixed points, 311
interpolation, 25
radiative, 351
scales, 312
stagnation, 363
standards, 25, 460
static, 363, 364
thermal expansion, 4, 313, 314
thermodynamic, 25, 312
thermoelectric, 330–350
total, 363, 365
t estimator, 131, 145
Test plan. See Measurement plan
Thermal anemometer, 408, 409, 414,
415
Thermal flow meter, 455
turndown, 455
uncertainty, 455
Thermistor, 323
circuit, 324
dissipation constant, 325, 327
zero-power resistance, 325
Index 589