E1BINDEX 09/09/2010
18:13:50 Page 586
D’Arsonval movement, 210–212, 214
Data acquisition, 260
controller, 287
plug-in board, 288–289
Data-acquisition error, 169, 190
Data-acquisition system, 260, 283–288
Data-reduction error, 169–170, 186
dc component, 46
dc offset, 46, 48
da Vinci, Leonardo, 424, 448
Dead volume, 401, 404
Deadweight tester, 384–386, 392, 395
Deflection mode, 211, 212, 323
Degree, 310
Degrees of freedom, 130, 131, 134–136,
138, 139, 141, 145, 148, 170, 184,
185, 188, 189, 191, 192, 194. See
also Welch–Satterwaite estimate
Derived units, 26, 28
Design-stage uncertainty, 164–168, 176,
180, 322, 323, 479
Design of experiments, 6, 10, 14
Deviation plot, 17
DFT. See Fourier transform-discrete
Differential-ended connection, 290–292,
297, 347
Digital:
signals, 43, 44, 47, 260, 287, 518
voltmeter, 217, 220, 222, 282
Digital-to-Analog converter (D/A),
271–273, 287
Dimension, 23
base, 24–26
derived, 27
electrical, 27–28
length, 25
mass, 24
temperature, 25
time, 24–25
Direct memory access, 579
Discharge coefficient, 429–433, 443
Discrete Fourier transform, 65–69, 261
amplitude ambiguity, 266–268
leakage,268
resolution, 66, 268
Discrete time signal, 42, 65, 263, 266
Displacement measurement, 510, 529
LVDT, 508
potentiometer, 505
Distortion, 106, 215, 515
Doppler
anemometry. See laser Doppler
anemometer
effect, 410, 453
flow meters, 453–454
shift, 410, 411
Doppler, Johann, 410
Dynamic calibration, 16, 392, 393
Dynamic error, 94, 95, 103, 242, 244, 245,
514
Dynamic pressure. See Pressure, dynamic
Dynamometer, 529, 531
absorbing, 531
ac and dc generators, 532
cradled, 531–533
eddy current, 532
engine, 529
waterbrake, 532–533
E
Earth ground, 250, 251
Elastic behavior of materials, 467
Electrodynamometer, 212, 214
Electromagnetic flow meter, 446–448
uncertainty, 448
Electromotive force (emf), 27, 213, 331,
446, 507
Electronic reference junction, 334
Emissive power, 351–352
End standard. See Standard, end
Error:
bias. See Error, systematic
correlated, 195–197
random, 197
systematic, 195–197
hysteresis, 20
instrument, 23, 165, 171
linearity, 21–22
loading, 212, 226
overall instrument, 23
precision. See Error, random
random, 18–20, 31, 88, 118, 119, 132,
142, 144, 161–164, 171–172, 183,
184
repeatability, 22
reproducibility, 23
sensitivity, 22
systematic, 18–20, 125, 126, 132–134,
152, 162, 163, 170–171, 183, 184,
186, 192, 194
temperature measurement, 309
zero shift, 22, 386
Error fraction, 86–88, 98
Euler formulas, 56, 61
Euler, Leonhard, 424
Expansion factor, 429–430, 432, 433
Experimental design, 6, 10, 14
External memory, 239
Extraneous variable, 7–13, 177, 314, 356
F
Fahrenheit, Gabriel D., 310
Faraday, Michael, 446, 506
Feedback control, 5, 288, 537, 541, 546
FFT. See Fourier transform, fast
Filter:
active, 240, 247–250
analog, 240, 284
anti-alias, 298
band, 102
bandpass, 239–241, 248, 249
Bessel, 241, 247, 249, 250
Butterworth, 240–250
design, 240, 241, 243
high-pass, 239–241, 244, 246–250
Linkwitz–Riley, 246
low-pass, 239, 240, 242, 244, 246,
248–250, 264
multiple, 241
notch, 239, 240
passive, 240, 241
roll-off, 241
Sallen–Key, 249, 250
Finite statistics, 130
sample mean, 130, 132
sample standard deviation, 130
standard deviation of the means,
132–134
First-order systems, 85–88, 90–95, 97,
104, 105, 111, 241, 405, 541
First-order uncertainty, 178, 179, 181
Flip-flop, 237–239
Flow coefficient, 8, 429
Flow meter. See also listings by type.
accuracy, 423
placement, 442
pressure loss, 443
prover, 459
selection, 443
Flow nozzle, 427, 432
ASME long radius, 432
discharge coefficient, 433
expansion factor, 433
pressure loss, 431
pressure taps, 433
uncertainty, 433
Flow rate.
actual, 460
mass, 423, 454
standard, 460
volume, 423
Folding diagram, 264, 265
Force measurement, 525–529
Forcing function, 82, 107, 401, 510, 544,
553
Fourier:
analysis, 50
coefficients, 56, 68
cosine series, 58
frequency content, 16, 53
harmonics, 53
series, 53, 56
sine series, 58
Fourier transform, 63, 65
amplitudes, 63, 65
amplitude spectrum, 65
discrete. See Discrete Fourier
inverse, 64
power spectrum, 65
transform fast, 66
Francis, James, 432
Freeman, John Ripley, 435
Frequency, 16, 24, 41, 49, 52, 56, 63, 69
586 Index
18:13:50 Page 586
D’Arsonval movement, 210–212, 214
Data acquisition, 260
controller, 287
plug-in board, 288–289
Data-acquisition error, 169, 190
Data-acquisition system, 260, 283–288
Data-reduction error, 169–170, 186
dc component, 46
dc offset, 46, 48
da Vinci, Leonardo, 424, 448
Dead volume, 401, 404
Deadweight tester, 384–386, 392, 395
Deflection mode, 211, 212, 323
Degree, 310
Degrees of freedom, 130, 131, 134–136,
138, 139, 141, 145, 148, 170, 184,
185, 188, 189, 191, 192, 194. See
also Welch–Satterwaite estimate
Derived units, 26, 28
Design-stage uncertainty, 164–168, 176,
180, 322, 323, 479
Design of experiments, 6, 10, 14
Deviation plot, 17
DFT. See Fourier transform-discrete
Differential-ended connection, 290–292,
297, 347
Digital:
signals, 43, 44, 47, 260, 287, 518
voltmeter, 217, 220, 222, 282
Digital-to-Analog converter (D/A),
271–273, 287
Dimension, 23
base, 24–26
derived, 27
electrical, 27–28
length, 25
mass, 24
temperature, 25
time, 24–25
Direct memory access, 579
Discharge coefficient, 429–433, 443
Discrete Fourier transform, 65–69, 261
amplitude ambiguity, 266–268
leakage,268
resolution, 66, 268
Discrete time signal, 42, 65, 263, 266
Displacement measurement, 510, 529
LVDT, 508
potentiometer, 505
Distortion, 106, 215, 515
Doppler
anemometry. See laser Doppler
anemometer
effect, 410, 453
flow meters, 453–454
shift, 410, 411
Doppler, Johann, 410
Dynamic calibration, 16, 392, 393
Dynamic error, 94, 95, 103, 242, 244, 245,
514
Dynamic pressure. See Pressure, dynamic
Dynamometer, 529, 531
absorbing, 531
ac and dc generators, 532
cradled, 531–533
eddy current, 532
engine, 529
waterbrake, 532–533
E
Earth ground, 250, 251
Elastic behavior of materials, 467
Electrodynamometer, 212, 214
Electromagnetic flow meter, 446–448
uncertainty, 448
Electromotive force (emf), 27, 213, 331,
446, 507
Electronic reference junction, 334
Emissive power, 351–352
End standard. See Standard, end
Error:
bias. See Error, systematic
correlated, 195–197
random, 197
systematic, 195–197
hysteresis, 20
instrument, 23, 165, 171
linearity, 21–22
loading, 212, 226
overall instrument, 23
precision. See Error, random
random, 18–20, 31, 88, 118, 119, 132,
142, 144, 161–164, 171–172, 183,
184
repeatability, 22
reproducibility, 23
sensitivity, 22
systematic, 18–20, 125, 126, 132–134,
152, 162, 163, 170–171, 183, 184,
186, 192, 194
temperature measurement, 309
zero shift, 22, 386
Error fraction, 86–88, 98
Euler formulas, 56, 61
Euler, Leonhard, 424
Expansion factor, 429–430, 432, 433
Experimental design, 6, 10, 14
External memory, 239
Extraneous variable, 7–13, 177, 314, 356
F
Fahrenheit, Gabriel D., 310
Faraday, Michael, 446, 506
Feedback control, 5, 288, 537, 541, 546
FFT. See Fourier transform, fast
Filter:
active, 240, 247–250
analog, 240, 284
anti-alias, 298
band, 102
bandpass, 239–241, 248, 249
Bessel, 241, 247, 249, 250
Butterworth, 240–250
design, 240, 241, 243
high-pass, 239–241, 244, 246–250
Linkwitz–Riley, 246
low-pass, 239, 240, 242, 244, 246,
248–250, 264
multiple, 241
notch, 239, 240
passive, 240, 241
roll-off, 241
Sallen–Key, 249, 250
Finite statistics, 130
sample mean, 130, 132
sample standard deviation, 130
standard deviation of the means,
132–134
First-order systems, 85–88, 90–95, 97,
104, 105, 111, 241, 405, 541
First-order uncertainty, 178, 179, 181
Flip-flop, 237–239
Flow coefficient, 8, 429
Flow meter. See also listings by type.
accuracy, 423
placement, 442
pressure loss, 443
prover, 459
selection, 443
Flow nozzle, 427, 432
ASME long radius, 432
discharge coefficient, 433
expansion factor, 433
pressure loss, 431
pressure taps, 433
uncertainty, 433
Flow rate.
actual, 460
mass, 423, 454
standard, 460
volume, 423
Folding diagram, 264, 265
Force measurement, 525–529
Forcing function, 82, 107, 401, 510, 544,
553
Fourier:
analysis, 50
coefficients, 56, 68
cosine series, 58
frequency content, 16, 53
harmonics, 53
series, 53, 56
sine series, 58
Fourier transform, 63, 65
amplitudes, 63, 65
amplitude spectrum, 65
discrete. See Discrete Fourier
inverse, 64
power spectrum, 65
transform fast, 66
Francis, James, 432
Freeman, John Ripley, 435
Frequency, 16, 24, 41, 49, 52, 56, 63, 69
586 Index