Fig. 4. Digraph model of a complex electronic system structure
Table 1. Fault detection rate
Test type
Fault
detection
rate
Fault
coverage
rate
Fault isolation rate
Reach one
LRU
Reach two
LRU
Reach
three LRU
External test
equipment
75.23%
79.15%
70.45%
78.89%
88.61%
396
L. Ou and F. Bai