5 Conclusion
Complex electronic system has complicated principal and excess amount of single
equipment and malfunctions, which makes it difficult to run quick failure diagnosis. It
is necessary to optimize its testability design at the beginning of the design, improve
the testability of the system and improve the supportability of equipment use and
maintenance. The article firstly analyzes the relationship between the testability model
and fault model, as well as the current technology development status. Secondly, it
introduces the definition of digraph, digraph model, fault diagnosis model based on
digraph and the modeling method and process of correlation graphic model. On this
basis, it proposes the integrated technology of testability design and diagnosis for
complex electronic information systems. Taking vehicle electronic information system
as an example, it establishes the function digraph model and analyzes its testability.
The results show that the conclusion of the model analysis is consistent with the actual
situation.
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