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T. B. Asafa et al.
Fig. 20 FESEM micrographs for a Al 2 O 3 nanoparticles, b TiO 2 nanoparticles (Ali et al. 2016), c,
d as-prepared Cu 2 O product at lower and higher magnification (Sun et al. 2014)
limited conductive coating on sample surface. In addition, FESEM uses in-lens detectors which are optimized to work at high resolution and very low acceleration potential which is fundamental for getting the maximum performance from the equipment.
FESEM has a long operating lifetime, but requires a much higher vacuum and is more
easily contaminated. Therefore, it needs to be “flashed” very frequently.
Good examples of FE-SEM images are shown in Fig. 20. The morphology of
Al 2 O 3 and TiO 2 nanoparticles (Fig. 20 a, b) shows that the nanoparticles were fairly
spherical in shape providing a very good rolling performance in the medium where
they are utilized (Ali et al. 2016). The FESEM image of Cu 2 O acquired at lower
magnification (Fig. 20c) indicates uniform and monodisperse highly symmetric polyhedral microcrystals while a single particle observed at and higher magnification
shows the cuboctahedral configuration of each particle (Sun et al. 2014).
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