Characterization Techniques in Nanotechnology …
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2.3 Transmission Electron Microscopy
The transmission electron microscope (TEM) is an instrument used for analyzing
internal microstructure of specimen and evaluation of nanostructures such as particles, fibers, thin films, and imaging of atoms (Inkson 2016; Tsang et al. 2005; Carter
and Williams 2016; Spence et al. 2006; Goodhew et al. 2001). Figure 21 presents the
core components of the TEM microscope which includes the electron gun, electrostatic lenses, and a transmitted electron detection system. The electron gun in a TEM
has the capacity to accelerate electrons using 80–300 kV accelerating voltage to give
Fig. 21 Schematic diagram of the core components of TEM microscope (Inkson 2016)
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2.3 Transmission Electron Microscopy
The transmission electron microscope (TEM) is an instrument used for analyzing
internal microstructure of specimen and evaluation of nanostructures such as particles, fibers, thin films, and imaging of atoms (Inkson 2016; Tsang et al. 2005; Carter
and Williams 2016; Spence et al. 2006; Goodhew et al. 2001). Figure 21 presents the
core components of the TEM microscope which includes the electron gun, electrostatic lenses, and a transmitted electron detection system. The electron gun in a TEM
has the capacity to accelerate electrons using 80–300 kV accelerating voltage to give
Fig. 21 Schematic diagram of the core components of TEM microscope (Inkson 2016)