9 Usage of Silicon for Label-Free Super-Resolved Imaging
231
Fig. 9.14 The dip in the IR probe Gaussian beam induced by the green pump beam. a The image
of the transmitted Gaussian probe beam with its profile. b The probe beam shaped by the pump
beam superimposed on it to create a dip in its center (see visualization 1 video that shows lateral
and temporal behavior between probe and pump beams). One diffraction limit unit is 600 μm.
Reproduced from [32]
Fig. 9.15 Probe Gaussian IR laser beam at the diffraction limit scan across a three-bars target (with
a period of 500 μm) in two cases: a without the pump beam, which shows unresolved target. The
second case, b is a scan of the target with the pump beam, with the dip in it, shows super-resolution
where the target is well resolved. The red lines are the direct scan results and the blue lines are the
direct scan results deconvoluted with the probe beam. Reproduced from [32]
231
Fig. 9.14 The dip in the IR probe Gaussian beam induced by the green pump beam. a The image
of the transmitted Gaussian probe beam with its profile. b The probe beam shaped by the pump
beam superimposed on it to create a dip in its center (see visualization 1 video that shows lateral
and temporal behavior between probe and pump beams). One diffraction limit unit is 600 μm.
Reproduced from [32]
Fig. 9.15 Probe Gaussian IR laser beam at the diffraction limit scan across a three-bars target (with
a period of 500 μm) in two cases: a without the pump beam, which shows unresolved target. The
second case, b is a scan of the target with the pump beam, with the dip in it, shows super-resolution
where the target is well resolved. The red lines are the direct scan results and the blue lines are the
direct scan results deconvoluted with the probe beam. Reproduced from [32]