26. V.G.M. Sivel, J. Van den Brand, W.R. Wang, H. Mohdadi, F.D. Tichelaar, P.F.A. Alkemade,
H.W. Zandbergen, Application of the dual-beam FIB/SEM to metals research. J. Microsc.
214, 237–245 (2004). doi:10.1111/j.0022-2720.2004.01329.x
27. B. Titze, Techniques to prevent sample surface charging and reduce beam damage effects for
SBEM imaging. Dissertation. Heidelberg University. 1–112 (2013)
28. S. Serrano-Zabaleta, A. Larrea, H. Stegmann, C. Waltenberg, Electron backscatter diffraction
analysis of non-conductive samples using in-situ charge compensation. Microsc. Anal 9, 23–
26 (2013)
29. D. Drobne, M. Milani, A. Zrimec, V. Leser, M. Berden Zrimec, Electron and ion imaging of
gland cells using the FIB/SEM system. J. Microsc. 219, 29–35 (2005). doi:10.1111/j.13652818.2005.01490.x
30. K. Roberston, R. Gauvin, J. Finch, Application of charge contrast imaging in mineral
characterization. Miner. Eng. 18, 343–352 (2005)
31. A.A. Wanner, C. Genoud, T. Masudi, L. Siksou, R.W. Friedrich, Dense EM-based
reconstruction of the interglomerular projectome in the zebrafish olfactory bulb. Nat.
Neurosci. 19, 816–825 (2016). doi:10.1038/nn.4290
32. G. Knott, S. Rosset, M. Cantoni, Focussed ion beam milling and scanning electron
microscopy of brain tissue. JoVE 53, 1–4 (2011). doi:10.3791/2588
33. K.M. Boergens, W. Denk, Controlling FIB-SBEM slice thickness by monitoring the
transmitted ion beam. J. Microsc. 252, 258–262 (2013). doi:10.1111/jmi.12086
34. K. Narayan, C.M. Danielson, K. Lagarec, B.C. Lowekamp, P. Coffman, A. Laquerre, M.W.
Phaneuf, T.J. Hope, S. Subramaniam, Multi-resolution correlative focused ion beam scanning
electron microscopy: Applications to cell biology. J. Struct. Biol. 185, 278–284 (2014).
doi:10.1016/j.jsb.2013.11.008
35. J.L. Schroeder, M. Bakalar, T.J. Pohida, R.S. Balaban, Rapid overlapping-volume acquisition
and reconstruction (ROVAR): automated 3D tiling for high-resolution, large field-of-view
optical microscopy. J. Microsc. 243, 103–110 (2011). doi:10.1111/j.1365-2818.2011.03490.x
36. N. Ohno, M. Katoh, Y. Saitoh, S. Saitoh, S. Ohno, Three‐dimensional volume imaging with
electron microscopy toward connectome. Microscopy 64, 17–26 (2015). doi:10.1093/jmicro/
dfu112
37. M.A. Karreman, L. Mercier, N.L. Schieber, G. Solecki, G. Allio, F. Winkler, B.
Ruthensteiner, J.G. Goetz, Y. Schwab, Fast and precise targeting of single tumor cells
in vivo by multimodal correlative microscopy. J. Cell Sci. 129, 444–456 (2016). doi:10.1242/
jcs.181842
38. A.P. Merkle, L. Lechner, S. Andy, J. Gelb, M. Kienle, M.W. Phaneuf, D. Unrau, S.S. singh,
N. Chawla, Automated correlative tomography using XRM and FIB-SEM to span length
scales and modalities in 3D materials. Microsc. Anal. 28, 1–4 (2014)
39. E.A. Bushong, D.D. Johnson, K.-Y. Kim, M. Terada, M. Hatori, S.T. Peltier, S. Panda, A.
Merkle, M.H. Ellisman, X-ray microscopy as an approach to increasing accuracy and efficiency
of serial block-face imaging for correlated light and electron microscopy of biological
specimens. Microsc. Microanal. 21(1), 231–238 (2015). doi:10.1017/S1431927614013579
40. K.L. McDonald, Out with the old and in with the new: rapid specimen preparation procedures
for electron microscopy of sectioned biological material. Protoplasma 251, 429–448 (2013).
doi:10.1007/s00709-013-0575-y
41. T.J. Deerinck, E.A. Bushong, A. Thor, M.H. Ellisman, SBEM Protocol v7_01_10. In: httpswww.
ncmir.ucsd.edusbem-protocol. https://www.ncmir.ucsd.edu/sbem-protocol/. Accessed 18 Feb 2017
42. T.J. Deerinck, E.A. Bushong, V. Lev-Ram, X. Shu, R.Y. Tsien, M.H. Ellisman, Enhancing
Serial Block-Face Scanning Electron Microscopy to Enable High Resolution 3-D
Nanohistology of Cells and Tissues. Microsc. Microanal. 16, 1138–1139 (2010). doi:10.
1017/S1431927610055170
43. J.C. Tapia, N. Kasthuri, K.J. Hayworth, R. Schalek, J.W. Lichtman, S.J. Smith, J. Buchanan,
High-contrast en bloc staining of neuronal tissue for field emission scanning electron
microscopy. Nat. Protoc. 7, 193–206 (2012). doi:10.1038/nprot.2011.439
5 Volume Scanning Electron Microscopy: Serial Block-Face …
145
H.W. Zandbergen, Application of the dual-beam FIB/SEM to metals research. J. Microsc.
214, 237–245 (2004). doi:10.1111/j.0022-2720.2004.01329.x
27. B. Titze, Techniques to prevent sample surface charging and reduce beam damage effects for
SBEM imaging. Dissertation. Heidelberg University. 1–112 (2013)
28. S. Serrano-Zabaleta, A. Larrea, H. Stegmann, C. Waltenberg, Electron backscatter diffraction
analysis of non-conductive samples using in-situ charge compensation. Microsc. Anal 9, 23–
26 (2013)
29. D. Drobne, M. Milani, A. Zrimec, V. Leser, M. Berden Zrimec, Electron and ion imaging of
gland cells using the FIB/SEM system. J. Microsc. 219, 29–35 (2005). doi:10.1111/j.13652818.2005.01490.x
30. K. Roberston, R. Gauvin, J. Finch, Application of charge contrast imaging in mineral
characterization. Miner. Eng. 18, 343–352 (2005)
31. A.A. Wanner, C. Genoud, T. Masudi, L. Siksou, R.W. Friedrich, Dense EM-based
reconstruction of the interglomerular projectome in the zebrafish olfactory bulb. Nat.
Neurosci. 19, 816–825 (2016). doi:10.1038/nn.4290
32. G. Knott, S. Rosset, M. Cantoni, Focussed ion beam milling and scanning electron
microscopy of brain tissue. JoVE 53, 1–4 (2011). doi:10.3791/2588
33. K.M. Boergens, W. Denk, Controlling FIB-SBEM slice thickness by monitoring the
transmitted ion beam. J. Microsc. 252, 258–262 (2013). doi:10.1111/jmi.12086
34. K. Narayan, C.M. Danielson, K. Lagarec, B.C. Lowekamp, P. Coffman, A. Laquerre, M.W.
Phaneuf, T.J. Hope, S. Subramaniam, Multi-resolution correlative focused ion beam scanning
electron microscopy: Applications to cell biology. J. Struct. Biol. 185, 278–284 (2014).
doi:10.1016/j.jsb.2013.11.008
35. J.L. Schroeder, M. Bakalar, T.J. Pohida, R.S. Balaban, Rapid overlapping-volume acquisition
and reconstruction (ROVAR): automated 3D tiling for high-resolution, large field-of-view
optical microscopy. J. Microsc. 243, 103–110 (2011). doi:10.1111/j.1365-2818.2011.03490.x
36. N. Ohno, M. Katoh, Y. Saitoh, S. Saitoh, S. Ohno, Three‐dimensional volume imaging with
electron microscopy toward connectome. Microscopy 64, 17–26 (2015). doi:10.1093/jmicro/
dfu112
37. M.A. Karreman, L. Mercier, N.L. Schieber, G. Solecki, G. Allio, F. Winkler, B.
Ruthensteiner, J.G. Goetz, Y. Schwab, Fast and precise targeting of single tumor cells
in vivo by multimodal correlative microscopy. J. Cell Sci. 129, 444–456 (2016). doi:10.1242/
jcs.181842
38. A.P. Merkle, L. Lechner, S. Andy, J. Gelb, M. Kienle, M.W. Phaneuf, D. Unrau, S.S. singh,
N. Chawla, Automated correlative tomography using XRM and FIB-SEM to span length
scales and modalities in 3D materials. Microsc. Anal. 28, 1–4 (2014)
39. E.A. Bushong, D.D. Johnson, K.-Y. Kim, M. Terada, M. Hatori, S.T. Peltier, S. Panda, A.
Merkle, M.H. Ellisman, X-ray microscopy as an approach to increasing accuracy and efficiency
of serial block-face imaging for correlated light and electron microscopy of biological
specimens. Microsc. Microanal. 21(1), 231–238 (2015). doi:10.1017/S1431927614013579
40. K.L. McDonald, Out with the old and in with the new: rapid specimen preparation procedures
for electron microscopy of sectioned biological material. Protoplasma 251, 429–448 (2013).
doi:10.1007/s00709-013-0575-y
41. T.J. Deerinck, E.A. Bushong, A. Thor, M.H. Ellisman, SBEM Protocol v7_01_10. In: httpswww.
ncmir.ucsd.edusbem-protocol. https://www.ncmir.ucsd.edu/sbem-protocol/. Accessed 18 Feb 2017
42. T.J. Deerinck, E.A. Bushong, V. Lev-Ram, X. Shu, R.Y. Tsien, M.H. Ellisman, Enhancing
Serial Block-Face Scanning Electron Microscopy to Enable High Resolution 3-D
Nanohistology of Cells and Tissues. Microsc. Microanal. 16, 1138–1139 (2010). doi:10.
1017/S1431927610055170
43. J.C. Tapia, N. Kasthuri, K.J. Hayworth, R. Schalek, J.W. Lichtman, S.J. Smith, J. Buchanan,
High-contrast en bloc staining of neuronal tissue for field emission scanning electron
microscopy. Nat. Protoc. 7, 193–206 (2012). doi:10.1038/nprot.2011.439
5 Volume Scanning Electron Microscopy: Serial Block-Face …
145