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scanning electron microscopy for materials science using ultramicrotomy. Ultramicroscopy
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5, 73–80 (1961). doi:10.2514/5.9781600864797.0073.0080
23. M.W. Phaneuf, Applications of focused ion beam microscopy to materials science specimens.
Micron 30, 277–288 (1999). doi:10.1016/s0968-4328(99)00012-8
24. K. Yonehara, N. Baba, K. Kanaya, Application of ion-beam etching techniques to the fine
structure of biological specimens as examined with a field emission SEM at low voltage.
J. Electron. Micrsc. Tech. 12, 71–77 (1989)
25. M. Cantoni, L. Holzer, Advances in 3D focused ion beam tomography. MRS Bulletin 39,
354–360 (2014) doi:10.1557/mrs.2014.54
144
R. I. Webb and N. L. Schieber
1021–1031 (2015). doi:10.1038/nmeth.3623
7. G. Knott, H. Marchman, D. Wall, B. Lich, Serial section scanning electron microscopy of
adult brain tissue using focused ion beam milling. J. Neurosci. 28, 2959–2964 (2008). doi:10.
1523/JNEUROSCI.3189-07.2008
8. K.L. Briggman, W. Denk, Towards neural circuit reconstruction with volume electron
microscopy techniques. Curr. Opin. Neurobiol. 16, 562–570 (2006). doi:10.1016/j.conb.2006.
08.010
9. M.R. Russell, T.R. Lerner, J.J. Burden, D.O. Nkwe, A. Pelchen-Matthews, M.C. Domart,
J. Durgan, A. Weston, M.L. Jones, C.J. Peddie, R. Carzaniga, O. Florey, M. Marsh, M.G.
Gutierrez, L.M. Collinson, 3D correlative light and electron microscopy of cultured cells
using serial blockface scanning electron microscopy. J. Cell Sci. JCS 130(1), 188433–14
(2016). doi:10.1242/jcs.188433
10. B. Titze, C. Genoud, Volume scanning electron microscopy for imaging biological
ultrastructure. Biol. Cell 1–29 (2016). doi:10.1111/boc.201600024
11. K.L. Briggman, D.D. Bock, Volume electron microscopy for neuronal circuit reconstruction.
Curr. Opin. Neurobiol. 22, 154–161 (2012). doi:10.1016/j.conb.2011.10.022
12. S.B. Leighton, SEM images of block faces, cut by a miniature microtome within the SEM-a
technical note. Scan. Electron. Microsc. 2, 73–76 (1980)
13. M. de Goede, E. Johlin, B. Sciacca, F. Boughorbel, E.C. Garnett, 3D multi-energy
deconvolution electron microscopy. Nanoscale 9, 684–689 (2017). doi:10.1039/
C6NR07991A
14. F. Boughorbel, E.G.T. Bosch, V. Kooijman, B. Lich, F, de Jong, Charged particale
microscopy imaging method. 1–15 (2013)
15. F. Boughorbel, X. Zhuge, P. Potocek, B. Lich, SEM 3D reconstruction of stained bulk
samples using landing energy variation and deconvolution. Microsc. Microanal. 1–2 (2012).
doi:10.1017/S1431927612004655
16. A. Kremer, S. Lippens, S. Bartunkova, B. Asselbergh, C. Blanpain, M. Fendrych, A.
Goosens, M. Holt, S. Janssens, M. Krols, J.C. Larsimont, C. McGuire, M.K. Nowack, X.
Saelens, A. Schertel, B. Schepens, M. Slezak, V. Timmerman, C. Theunis, R. van Brempt, Y.
Visser, C.J. Guerin, Developing 3D SEM in a broad biological context. J. Microsc. 259, 80–
96 (2015). doi:10.1111/jmi.12211
17. L. Hughes, C. Hawes, S. Monteith, S. Vaughan, Serial block face scanning electron
microscopy—the future of cell ultrastructure imaging. Protoplasma 251, 395–401 (2014).
doi:10.1007/s00709-013-0580-1
18. C.J. Peddie, L.M. Collinson, Exploring the third dimension: Volume electron microscopy
comes of age. Micron 61, 9 (2014). doi:10.1016/j.micron.2014.01.009
19. A. Zankel, J. Wagner, P. Poelt, Serial sectioning methods for 3D investigations in materials
science. Micron 62, 66–78 (2014). doi:10.1016/j.micron.2014.03.002
20. T. Hashimoto, G.E. Thompson, X. Zhou, P.J. Withers, 3D imaging by serial block face
scanning electron microscopy for materials science using ultramicrotomy. Ultramicroscopy
163, 6–18 (2016). doi:10.1016/j.ultramic.2016.01.005
21. C. Has, C. Sitaru, Molecular dermatology comes of age. Mol. Dermatolo. 961, 1–408 (2013).
doi:10.1007/978-1-62703-227-8
22. V.E. Krohn, Liquid Metal Droplets for Heavy Particle Propulsion. Prog. Astronaut. Rocketry
5, 73–80 (1961). doi:10.2514/5.9781600864797.0073.0080
23. M.W. Phaneuf, Applications of focused ion beam microscopy to materials science specimens.
Micron 30, 277–288 (1999). doi:10.1016/s0968-4328(99)00012-8
24. K. Yonehara, N. Baba, K. Kanaya, Application of ion-beam etching techniques to the fine
structure of biological specimens as examined with a field emission SEM at low voltage.
J. Electron. Micrsc. Tech. 12, 71–77 (1989)
25. M. Cantoni, L. Holzer, Advances in 3D focused ion beam tomography. MRS Bulletin 39,
354–360 (2014) doi:10.1557/mrs.2014.54
144
R. I. Webb and N. L. Schieber