44
J. Zhang et al.
JB/T 5754 was developed, which specifies the technical conditions, testing methods,
testing rules, signs and packaging of single-channel AE instruments. In addition, the
calibration standard JJF 1505 for the AE instruments has been developed in 2015
[2–9].
4.3.2 Comparison and Analysis
The standards for performance test of AE instruments in different countries are
compared in terms of test parameters and test devices, as shown in Table 4.2.
It is found that all the standards use the signal generator, Oscilloscope, Variable
attenuator, RMS voltmeter and some other devices to build the testing systems for
the performance test of AE instruments. In terms of test parameters, bandwidth,
threshold, and the measured AE burst signal parameters are all present in American, European and Chinese standards, which means that these parameters are very
important for the AE instrument performance. In addition, the American standards
also propose test methods for gain, dynamic range, dead time, counter accuracy, and
waveform accuracy. The European standards pay attention to the external parameter,
AE signal acquisition rate of the system, and the delta-t measurement. The Chinese
Table 4.2 Comparison of AE instrument test standards
Standard
Test parameters
Test devices
ASTM E750 Frequency Response and Bandwidth,
Threshold Level, Computer-Measured
Parameters, Gain, Dynamic Range,
Dead Time, Counter Accuracy,
Waveform Accuracy
Variable Sine Wave Generator or
Oscillator, True RMS Voltmeter,
Oscilloscope, Variable Attenuator, Tone
Burst Generator, Electronic AE
Simulator
EN 13477
JB/T 11603
Bandwidth, detection threshold, the
measured AE burst signal parameters,
the external parameter, AE signal
acquisition rate of the system, the
Delta-t measurement
Sweep function/variable pulse signal
generator, Random noise generator,
Dual channel storage oscilloscope,
Variable attenuator, Multimeter, RMS
voltmeter, DC Power supply
JB/T 8283
Bandwidth, Gain, Dynamic Range,
Noise, Overload recovery time, Input
impedance Output impedance,
Threshold voltage
Signal generator, Variable attenuator,
Oscilloscope, RMS voltmeter, Pulse
modulation signal generator
JB/T 5754
Bandwidth, detection threshold, the
measured AE burst signal parameters,
the external parameter, Temperature
resistance
Sweep function/variable pulse signal
generator, Random noise generator,
Dual channel storage oscilloscope,
Variable attenuator, Multimeter, RMS
voltmeter, DC Power supply, High and
low temperature test chamber
JJF 1505
Frequency range, Noise, Dynamic
range, Crosstalk between channels,
Waveform parameters
Function signal generator, Oscilloscope,
Variable attenuator, Digital AC
voltmeter, Reference preamplifier
J. Zhang et al.
JB/T 5754 was developed, which specifies the technical conditions, testing methods,
testing rules, signs and packaging of single-channel AE instruments. In addition, the
calibration standard JJF 1505 for the AE instruments has been developed in 2015
[2–9].
4.3.2 Comparison and Analysis
The standards for performance test of AE instruments in different countries are
compared in terms of test parameters and test devices, as shown in Table 4.2.
It is found that all the standards use the signal generator, Oscilloscope, Variable
attenuator, RMS voltmeter and some other devices to build the testing systems for
the performance test of AE instruments. In terms of test parameters, bandwidth,
threshold, and the measured AE burst signal parameters are all present in American, European and Chinese standards, which means that these parameters are very
important for the AE instrument performance. In addition, the American standards
also propose test methods for gain, dynamic range, dead time, counter accuracy, and
waveform accuracy. The European standards pay attention to the external parameter,
AE signal acquisition rate of the system, and the delta-t measurement. The Chinese
Table 4.2 Comparison of AE instrument test standards
Standard
Test parameters
Test devices
ASTM E750 Frequency Response and Bandwidth,
Threshold Level, Computer-Measured
Parameters, Gain, Dynamic Range,
Dead Time, Counter Accuracy,
Waveform Accuracy
Variable Sine Wave Generator or
Oscillator, True RMS Voltmeter,
Oscilloscope, Variable Attenuator, Tone
Burst Generator, Electronic AE
Simulator
EN 13477
JB/T 11603
Bandwidth, detection threshold, the
measured AE burst signal parameters,
the external parameter, AE signal
acquisition rate of the system, the
Delta-t measurement
Sweep function/variable pulse signal
generator, Random noise generator,
Dual channel storage oscilloscope,
Variable attenuator, Multimeter, RMS
voltmeter, DC Power supply
JB/T 8283
Bandwidth, Gain, Dynamic Range,
Noise, Overload recovery time, Input
impedance Output impedance,
Threshold voltage
Signal generator, Variable attenuator,
Oscilloscope, RMS voltmeter, Pulse
modulation signal generator
JB/T 5754
Bandwidth, detection threshold, the
measured AE burst signal parameters,
the external parameter, Temperature
resistance
Sweep function/variable pulse signal
generator, Random noise generator,
Dual channel storage oscilloscope,
Variable attenuator, Multimeter, RMS
voltmeter, DC Power supply, High and
low temperature test chamber
JJF 1505
Frequency range, Noise, Dynamic
range, Crosstalk between channels,
Waveform parameters
Function signal generator, Oscilloscope,
Variable attenuator, Digital AC
voltmeter, Reference preamplifier