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S. A. Pauline
3.2 Small Angle X-Ray Scattering
Small angle X-ray scattering is a surface analytical technique that measures the
intensity of scattered X-rays as a function of the scattering angle. A very narrow and
highly intense incident X-ray beam is focused on the material under study and the
behaviour of X-rays that have undergone elastic scattering is studied. Measurements
are made at very small angles in the range of < 5°. Nanoparticles in the size range
of 1–100 nm even up to 300 nm can be measured [54]. Structural features and
properties of nanomaterials such as particle shape, specific surface area, nanoparticle
size distribution, pore size distribution, agglomeration behavior of nanoparticles can
be studied. Any type of nanomaterial sample such as liquid nanoparticle dispersions,
nanopowders, nanocomposites, etc. can be examined by this method.
3.3 Energy-Dispersive X-Ray Spectroscopy
Energy-dispersive X-ray spectroscopy (EDS or EDX) is also known as energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA). It
is a microanalysis technique for identifying and measuring elemental compositions
on specific particles, morphologies, or isolated areas of the material on nano-scale
[55, 56]. It records the X-rays that are emitted from the material under study by
bombarding it by an electron beam. The EDS detector measures the emitted X-rays
as a function of their energy. The energy of the X-ray is characteristic of the elemental
composition of the chemical substance. From this, the various elements present and
their quantities can be determined [57]. The technique requires a very small sample
quantity for analysis and it has less or no sample preparation. This technique is
usually used in conjunction with SEM.
3.4 Thermal Analysis
Thermal analysis is a low cost and high-speed analysis method useful for verifying
the morphology and composition of nanoceramics. Many properties of nanoceramics
can be studied with the help of thermal analysis. In this method, nanoceramics
are heated to higher temperatures and the changes in the material are studied as
a function of temperature in the temperature range of −150 to 1600 °C. Properties
such as purity, composition, crystallization behavior, glass transition, melting, phase
changes, reaction enthalpies, surface area analysis, kinetics of reactive processes, etc.,
can be studied by thermal analysis [50]. The important thermal analysis techniques
S. A. Pauline
3.2 Small Angle X-Ray Scattering
Small angle X-ray scattering is a surface analytical technique that measures the
intensity of scattered X-rays as a function of the scattering angle. A very narrow and
highly intense incident X-ray beam is focused on the material under study and the
behaviour of X-rays that have undergone elastic scattering is studied. Measurements
are made at very small angles in the range of < 5°. Nanoparticles in the size range
of 1–100 nm even up to 300 nm can be measured [54]. Structural features and
properties of nanomaterials such as particle shape, specific surface area, nanoparticle
size distribution, pore size distribution, agglomeration behavior of nanoparticles can
be studied. Any type of nanomaterial sample such as liquid nanoparticle dispersions,
nanopowders, nanocomposites, etc. can be examined by this method.
3.3 Energy-Dispersive X-Ray Spectroscopy
Energy-dispersive X-ray spectroscopy (EDS or EDX) is also known as energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA). It
is a microanalysis technique for identifying and measuring elemental compositions
on specific particles, morphologies, or isolated areas of the material on nano-scale
[55, 56]. It records the X-rays that are emitted from the material under study by
bombarding it by an electron beam. The EDS detector measures the emitted X-rays
as a function of their energy. The energy of the X-ray is characteristic of the elemental
composition of the chemical substance. From this, the various elements present and
their quantities can be determined [57]. The technique requires a very small sample
quantity for analysis and it has less or no sample preparation. This technique is
usually used in conjunction with SEM.
3.4 Thermal Analysis
Thermal analysis is a low cost and high-speed analysis method useful for verifying
the morphology and composition of nanoceramics. Many properties of nanoceramics
can be studied with the help of thermal analysis. In this method, nanoceramics
are heated to higher temperatures and the changes in the material are studied as
a function of temperature in the temperature range of −150 to 1600 °C. Properties
such as purity, composition, crystallization behavior, glass transition, melting, phase
changes, reaction enthalpies, surface area analysis, kinetics of reactive processes, etc.,
can be studied by thermal analysis [50]. The important thermal analysis techniques