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J.I. Son, I.M. Kim, P. Kwak, B.K. Jung, D.S. Lee, H. Kim, H.J. Yang, D.S. Byeon, K.T. Park,
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6. D. Kang, W. Jeong, C. Kim, D.H. Kim, Y.S. Cho, K.T. Kang, J. Ryu, K.M. Kang, S. Lee,
W. Kim, H. Lee, J. Yu, N. Choi, D.S. Jang, J.D. Ihm, D. Kim, Y.S. Min, M.S. Kim, A.S. Park,
J.I. Son, I.M. Kim, P. Kwak, B.K. Jung, D.S. Lee, H. Kim, H.J. Yang, D.S. Byeon, K.T. Park,
K.H. Kyung, J.H. Choi, in 2016 IEEE International Solid-State Circuits Conference (ISSCC)
(2016), pp. 130–131. https://doi.org/10.1109/ISSCC.2016.7417941
7. S. Das, ITRS Assessment and Benchmarking of Emerging Logic Devices (Wiley, Chichester,
2014). https://doi.org/10.1002/9781118958254.ch20
8. D.A. Allwood, G. Xiong, C.C. Faulkner, D. Atkinson, D. Petit, R.P. Cowburn, Science 309,
1688 (2005). https://doi.org/10.1126/science.1108813
9. G. Csaba, W. Porod, A.I. Csurgay, Int. J. Circuit Theory Appl. 31, 67 (2003). https://doi.org/
10.1002/cta.226
10. A. Imre, G. Csaba, L. Ji, A. Orlov, G. Bernstein, W. Porod, Science 311, 205 (2006). https://
doi.org/10.1126/science.1120506
11. M.T. Niemier, G. Bernstein, G. Csaba, A. Dingler, X. Hu, S. Kurtz, S. Liu, J. Nahas, W. Porod,
M. Siddiq, E. Varga, J. Phys.: Cond. Matter 23, 493202 (2011). https://doi.org/10.1088/09538984/23/49/493202
12. E. Varga, M. Niemier, G. Csaba, G. Bernstein, W. Porod, IEEE Trans. Magnetics 49(7), 4452
(2013). https://doi.org/10.1109/TMAG.2013.2249576
13. G. Csaba, G.H. Bernstein, W. Porod, A. Orlov, M.T. Niemier, X.S. Hu, M. Becherer, S. Breitkreutz, J. Kiermaier, I. Eichwald, D. Schmitt-Landsiedel, X. Ju, P. Lugli, Nanomagnet Logic
(Wiley, 2015), pp. 1–18. https://doi.org/10.1002/047134608X.W8242
14. G. Csaba, P. Lugli, M. Becherer, D. Schmitt-Landsiedel, W. Porod, J. Comput. Electron. 7, 454
(2008). https://doi.org/10.1007/s10825-007-0157-3
15. M. Becherer, G. Csaba, R. Emling, W. Porod, P. Lugli, D. Schmitt-Landsiedel, in Digest
Technical Papers IEEE International Solid-State Circuits Conference. ISSCC 474–475 (2009).
https://doi.org/10.1109/ISSCC.2009.4977514
16. S. Breitkreutz, J. Kiermaier, I. Eichwald, X. Ju, G. Csaba, D. Schmitt-Landsiedel, M. Becherer,
IEEE Trans. Magn. 48(11), 4336 (2012). https://doi.org/10.1109/TMAG.2012.2197184
17. S. Breitkreutz, I. Eichwald, J. Kiermaier, A. Papp, G. Csaba, M. Niemier, W. Porod, D. SchmittLandsiedel, M. Becherer, EPJ Web Conf. 75, 05001 (2014). https://doi.org/10.1051/epjconf/
20147505001
18. S. Breitkreutz, R.L. Stamps, J. Åkerman, A.V. Chumak, Y.C. Otani, G.E.W. Bauer, J.U. Thiele,
M. Bowen, S.A. Majetich, M. Kläui, I.L. Prejbeanu, B. Dieny, N.M. Dempsey, B. Hillebrands, J. Phys. D: Appl. Phys. 47(33), 333001 (2014). https://doi.org/10.1088/0022-3727/
47/33/333001
19. M. Becherer, S. Breitkreutz-v. Gamm, I. Eichwald, G. Žiemys, J. Kiermaier, G. Csaba,
D. Schmitt-Landsiedel, Solid-State Electron. 115, Part B, 74 (2016). https://doi.org/10.1016/
j.sse.2015.08.004
20. O. Hellwig, A. Berger, J.B. Kortright, E.E. Fullerton, J. Magn. Magn. Mater. 319(1–2), 13
(2007). https://doi.org/10.1016/j.jmmm.2007.04.035
21. M. Johnson, P. Bloemen, F. Den Broeder, J. De Vries, Rep. Prog. Phys. 59(11), 1409 (1996).
https://doi.org/10.1088/0034-4885/59/11/002
22. M. Becherer, Nanomagnetic Logic in Focused Ion Beam Engineered Co/Pt Multilayer Films,
Selected Topics of Electronics and Micromechatronics, vol. 38 (Shaker Verlag, 2011)
23. S. Breitkreutz, J. Kiermaier, X. Ju, G. Csaba, D. Schmitt-Landsiedel, M. Becherer, in IEEE
Proceedings of the 41st European Solid-State Device Research Conference ESSDERC (2011),
pp. 323–326. https://doi.org/10.1109/ESSDERC.2011.6044169
24. J.H. Franken, M. Hoeijmakers, R. Lavrijsen, H.J.M. Swagten, J. Phys.: Condens. Matter 24,
024216 (2012). https://doi.org/10.1088/0953-8984/24/2/024216
25. S. Breitkreutz, J. Kiermaier, S.V. Karthik, G. Csaba, D. Schmitt-Landsiedel, M. Becherer, J.
Appl. Phys. 111(7), 07A715 (2012). https://doi.org/10.1063/1.3675171
26. W. Wernsdorfer, E.B. Orozco, K. Hasselbach, A. Benoit, B. Barbara, N. Demoncy, A. Loiseau,
H. Pascard, D. Mailly, Phys. Rev. Lett. 78, 1791 (1997). https://doi.org/10.1103/PhysRevLett.
78.1791