202
Strain-Engineered MOSFETs
References
1. International Technology Roadmap for Semiconductors (ITRS), http://public.
itrs.net/.
2. T. Sakurai, Perspectives of Power-Aware Electronics (Plenary), Proc. ISSCC Tech.
Dig., 26–29, 2003.
3. B. Razavi, A Study of Phase Noise in CMOS Oscillators, IEEE J. Solid-State Circ.,
31, 331–343, 1996.
4. A. Hajimiri and T. H. Lee, A General Theory of Phase Noise in Electrical
Oscillators, IEEE J. Solid-State Circ., 33, 179–194, 1998.
5. M. V. Haartman, Low-Frequency Noise Characterization, Evaluation and
Modelling of Advanced Si- and SiGe-Based CMOS Transistors, PhD thesis,
Royal Institute of Technology (KTH), Sweden, 2006.
6. M. J. Deen and O. Marinov, Noise in Advanced Electronic Devices and Circuits,
Proc. Int. Conf. Noise Fluctuations (ICNF), 3–12, 2005.
7. L. K. J. Vandamme, Noise as a Diagnostic Tool for Quality and Reliability of
Electronic Devices, IEEE Trans. Electron Dev., 41, 2176–2187, 1994.
8. M. J. Kirton and M. J. Uren, Noise in Solid-State Microstructures: A New
Perspective on Individual Defects, Interface States and Low-Frequency (1/f)
Noise, Adv. Phys., 38, 367–468, 1989.
9. L. K. J. Vandamme, X. Li, and D. Rigaud, 1/f Noise in MOS Devices, Mobility or
Number Fluctuations? IEEE Trans. Electron Dev., 41, 1936–1945, 1994.
10. W. Schottky, Über spontane Stromschwankungen in verschiedenen
Elektrizitätsleitern, Annalen Physik, 57, 541–567, 1918.
11. A. van der Ziel, Noise in Solid State Devices and Circuits, John Wiley & Sons, New
York, USA, 1986.
12. S. Machlup, Noise in Semiconductors: Spectrum of a Two-Parameter Random
Signal, J. Appl. Phys., 25, 341–343, 1954.
13. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Experimental
Studies on 1/f Noise, Rep. Prog. Phys., 44, 479–531, 1981.
14. M. Surdin, Fluctuations in the Thermionic Current and the “Flicker Effect,” J.
Phys. Radium, 10, 188–189, 1939.
15. F. N. Hooge, 1/f Noise Sources, IEEE Trans. Electron Dev., 41, 1926–1935, 1994.
16. F. N. Hooge, 1/f Noise Is No Surface Effect, Phys. Lett. A, 29, 139–140, 1969.
17. P. H. Handel, Fundamental Quantum 1/f Noise in Semiconductor Devices,
IEEE Trans. Electron Dev., 41, 2023–2033, 1994.
18. C. M. Van Vliet, A Survey of Results and Future Prospects on Quantum 1/f
Noise and 1/f Noise in General, Solid-State Electron., 34, 1–21, 1991.
19. T. Musha and M. Tacano, Dynamics of Energy Partition among Coupled
Harmonic Oscillators in Equilibrium, Physica A, 346, 339–346, 2005.
20. R. P. Jindal and A. van der Ziel, Phonon Fluctuation Model for Flicker Noise in
Elemental Semiconductors, J. Appl. Phys., 52, 2884–2888, 1981.
21. M. N. Mihaila, Phonon-Induced 1/f Noise in MOS Transistors, Fluctuation Noise
Lett., 4, L329–L343, 2004.
22. A. L. McWorther, Semiconductor Surface Physics, University of Pennsylvania
Press, Philadelphia, USA, 1957.
Strain-Engineered MOSFETs
References
1. International Technology Roadmap for Semiconductors (ITRS), http://public.
itrs.net/.
2. T. Sakurai, Perspectives of Power-Aware Electronics (Plenary), Proc. ISSCC Tech.
Dig., 26–29, 2003.
3. B. Razavi, A Study of Phase Noise in CMOS Oscillators, IEEE J. Solid-State Circ.,
31, 331–343, 1996.
4. A. Hajimiri and T. H. Lee, A General Theory of Phase Noise in Electrical
Oscillators, IEEE J. Solid-State Circ., 33, 179–194, 1998.
5. M. V. Haartman, Low-Frequency Noise Characterization, Evaluation and
Modelling of Advanced Si- and SiGe-Based CMOS Transistors, PhD thesis,
Royal Institute of Technology (KTH), Sweden, 2006.
6. M. J. Deen and O. Marinov, Noise in Advanced Electronic Devices and Circuits,
Proc. Int. Conf. Noise Fluctuations (ICNF), 3–12, 2005.
7. L. K. J. Vandamme, Noise as a Diagnostic Tool for Quality and Reliability of
Electronic Devices, IEEE Trans. Electron Dev., 41, 2176–2187, 1994.
8. M. J. Kirton and M. J. Uren, Noise in Solid-State Microstructures: A New
Perspective on Individual Defects, Interface States and Low-Frequency (1/f)
Noise, Adv. Phys., 38, 367–468, 1989.
9. L. K. J. Vandamme, X. Li, and D. Rigaud, 1/f Noise in MOS Devices, Mobility or
Number Fluctuations? IEEE Trans. Electron Dev., 41, 1936–1945, 1994.
10. W. Schottky, Über spontane Stromschwankungen in verschiedenen
Elektrizitätsleitern, Annalen Physik, 57, 541–567, 1918.
11. A. van der Ziel, Noise in Solid State Devices and Circuits, John Wiley & Sons, New
York, USA, 1986.
12. S. Machlup, Noise in Semiconductors: Spectrum of a Two-Parameter Random
Signal, J. Appl. Phys., 25, 341–343, 1954.
13. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Experimental
Studies on 1/f Noise, Rep. Prog. Phys., 44, 479–531, 1981.
14. M. Surdin, Fluctuations in the Thermionic Current and the “Flicker Effect,” J.
Phys. Radium, 10, 188–189, 1939.
15. F. N. Hooge, 1/f Noise Sources, IEEE Trans. Electron Dev., 41, 1926–1935, 1994.
16. F. N. Hooge, 1/f Noise Is No Surface Effect, Phys. Lett. A, 29, 139–140, 1969.
17. P. H. Handel, Fundamental Quantum 1/f Noise in Semiconductor Devices,
IEEE Trans. Electron Dev., 41, 2023–2033, 1994.
18. C. M. Van Vliet, A Survey of Results and Future Prospects on Quantum 1/f
Noise and 1/f Noise in General, Solid-State Electron., 34, 1–21, 1991.
19. T. Musha and M. Tacano, Dynamics of Energy Partition among Coupled
Harmonic Oscillators in Equilibrium, Physica A, 346, 339–346, 2005.
20. R. P. Jindal and A. van der Ziel, Phonon Fluctuation Model for Flicker Noise in
Elemental Semiconductors, J. Appl. Phys., 52, 2884–2888, 1981.
21. M. N. Mihaila, Phonon-Induced 1/f Noise in MOS Transistors, Fluctuation Noise
Lett., 4, L329–L343, 2004.
22. A. L. McWorther, Semiconductor Surface Physics, University of Pennsylvania
Press, Philadelphia, USA, 1957.