Self-seeding, 302
Semiconductor diode detector, 118
Sextupole magnet, 18
Shadow, 105
Shape resonance, 169, 170
Shaping amplifiers, 126
Single channel analyzer (SCA), 127
Site selective absorption, 201
Skutterudites, 275
Slater integrals, 175
Snell’s law, 71
Solid-state detector, 118
Space-charge effects, 293
Spectral brightness, 3
Speed of sound, 270
Spin sum rule, 186
Spin-orbit coupling, 195
Spin-orbit interaction, 176
Spin-polarized photoemission, 286
Spin-resolved photoemission (SPES), 286
Spin-selective absorption, 202
SRXPS, 286
Stokes parameters, 64
Storage ring, 16
Storage Ring Components
kicker magnet, 27
lattice, 19
septum magnet, 27
Streak cameras, 121
Streak detectors, 121
Structure factor, 86
Sum-rule analysis, 267
Superbend, 28
Superconducting Tunnel Junction (STJ), 122
Superconducting undulator (SCU), 33
Synchronicity condition, 25
Synchrotron oscillations, 19
Synchrotron radiation (SR), 2, 5
Synchrotron radiation perturbed angular
correlation (SRPAC), 248
Synchrotron radiation universal function, 46
T
Tangential rays, 76
Thermal Diffuse Scattering (TDS), 219
Thermionic emission, 13
Time-to-amplitude converter (TAC), 127
Time-to-digital converter (TDC), 127
Topological insulator, 187
Total electron-yield (TEY), 135
Total external reflection, 74
Total internal reflection, 74
Touschek effect, 21
Townsend avalanche, 115
Transition edge sensor (TES), 125
Transmittance (T), 131
Transverse acceptance, 21
Triple-bend achromat, 20
Truncation effects, 158
Tune, 19
Tune diagram, 19
Twiss parameters, 22
U
umweganregung, 138
Undulator equation, 54
Undulators, 49, 52
V
Vacancy sum rule, 181
Vibrational density of states, 146
Victoreen function, 155
W
Wavelength shifter, 28
Wiggler, 52
X
X-PEEM, 188
X-ray free electron laser oscillator
(XFELO), 302
X-ray magnetic circular dichroism (XMCD),
181, 182
X-ray Raman scattering (XRS), 214
Z
Zeeman splitting, 232
Zone plates, 84
388
Index