D
Dark current, 109
Dark noise, 109
Dead time, 109, 137
DeBroglie equation, 141
Debye model, 267
Diamond anvil cells, 274
Diffraction limit, 23
Diffraction limited storage ring (DLSR), 24
Direct RIXS, 205
Disc-loaded’ waveguide, 15
Discriminator, 127
Dispersion curve, 222
Dumond diagram, 87
Dynamical beats, 243
Dynamical diffraction theory, 86
E
Effective distribution function, 151
Einstein solid, 237
Electrometer, 112
Electron Spectroscopy for Chemical Analysis
(ESCA), 280
Elliptically-polarizing undulator, 35
Elliptical undulator (EPU), 53, 63
Elliptical wigglers, 34
Emittance, 23, 98
Emitter time, 40
Energy resolution, 109
Exchange interaction, 175
Exotic insertion devices, 66
Extended X-ray Absorption Fine Structure
(EXAFS), 138
Extreme backscattering, 89
Extrinsic losses, 148
F
Fano factor, 119
Fano resonances, 168
Figure, 77
Fill pattern, 25
Finish, 77
Fluorescence excitation spectrum, 133
Fluorescence yield (FY), 133
F n (K ), 56
Focusing strength k, 17
FODO lattice, 20
Fourier log method, 273
Fresnel equations, 72
G
Gap scan, 35
Gas proportional counter, 116
Gates, 128
Geiger counter, 115
Geiger-Müller tube, 115
Glitch, 138
Graded multilayers, 98
Grating equation, 80
H
Hard X-ray Photoelectron Spectroscopy
(HAXPS), 284
Harmonic number, 25
Harmonic oscillator, 261
Helical undulator, 34, 53
High energy resolution fluorescence detection
(HERFD), 200
High-gain harmonic generation
(HGHG), 301
Hyperfine interactions, 231
I
Image plates, 110
Index of refraction, 70
Indirect RIXS, 206
Inelastic structure factor, 221
Inelastic X-ray scattering (IXS), 219
Insertion devices (IDs), 28, 49
Internal conversion, 229
Internal conversion coefficient, 229
Intrinsic efficiency, 109
Intrinsic losses, 148
Inverse partial fluorescence yield, 134
Ion chamber, 110
Ion trapping, 26
Iron pnictide, 223
Isomer shift, 232
J
Jupiter, 8
K
Kinematical approximation, 85
Kramers-Heisenberg equation, 205
386
Index