Fig. 27 Payne effect variation of the storage modulus versus deformation at different silica
concetration ω ¼ 10 rad/s. (a) EVA/xylene, 100/0, melt EVA, T ¼ 140
C, (b) EVA/xylene:
78/22, t ¼ 21
C (c) EVA/xylene 92.5/7.5, T ¼ 21
C
224
G. Markovic ´ et al.
concetration ω ¼ 10 rad/s. (a) EVA/xylene, 100/0, melt EVA, T ¼ 140
C, (b) EVA/xylene:
78/22, t ¼ 21
C (c) EVA/xylene 92.5/7.5, T ¼ 21
C
224
G. Markovic ´ et al.