Simplified Detection of Serotonin by FET-Based Sensor
33
kept in sterilized containers for further experimentation. The study has been approved
by the appropriate institutional ethics committee (No. NBPHC/187 dated 11th May,
2019), and blood sampling and experimentation have been performed in accordance
with the 1964 Helsinki Declaration and its later amendments or comparable ethical
standards.
3 Results and Discussion
3.1 Structural Characterization
The surface morphological study has been conducted with high-resolution FESEM
with an operating voltage of 10 kV and magnification of 100 K. The top view of
FESEM micrograph of the ZnO samples is shown in Fig. 1. Therefore, film continuity has been confirmed from the FESEM micrograph. Average grain size has been
found to be around 60 nm. The XRD pattern of the rapidly grown ZnO nanorod
exhibited diffraction peak along (002) plane at 2θ ≈ 34.4° (Fig. 2). The diffraction
peak (002) denoted the unit cell of the crystal to be hexagonal in growth with its
c-axis perpendicular to that of the glass substrate. Besides, clear sharpness and no
impurity diffraction peaks indicate the crystallinity along with the high purity of the
fabricated ZnO nanorod.
Fig. 1 FESEM micrograph of ZnO seed layer
33
kept in sterilized containers for further experimentation. The study has been approved
by the appropriate institutional ethics committee (No. NBPHC/187 dated 11th May,
2019), and blood sampling and experimentation have been performed in accordance
with the 1964 Helsinki Declaration and its later amendments or comparable ethical
standards.
3 Results and Discussion
3.1 Structural Characterization
The surface morphological study has been conducted with high-resolution FESEM
with an operating voltage of 10 kV and magnification of 100 K. The top view of
FESEM micrograph of the ZnO samples is shown in Fig. 1. Therefore, film continuity has been confirmed from the FESEM micrograph. Average grain size has been
found to be around 60 nm. The XRD pattern of the rapidly grown ZnO nanorod
exhibited diffraction peak along (002) plane at 2θ ≈ 34.4° (Fig. 2). The diffraction
peak (002) denoted the unit cell of the crystal to be hexagonal in growth with its
c-axis perpendicular to that of the glass substrate. Besides, clear sharpness and no
impurity diffraction peaks indicate the crystallinity along with the high purity of the
fabricated ZnO nanorod.
Fig. 1 FESEM micrograph of ZnO seed layer