418
A. Dey et al.
The spiro-OMeTAD (Sigma-Aldrich, 99%) was used as electrolyte and conductive
silver paste was used as counter electrode.
2.5 Characterization of Materials and Solar Cells
X-ray diffraction (XRD, Ultima III, Rigaku, Japan) with Cu Kα radiation was
used for analyzing the crystal structure of the sample. For estimating the morphological characteristics, scanning electron microscopy (model: EVO 18 Special
Edition, ZEISS make) was used. The absorption characteristics were analyzed
using a HITACHI-make UV/vis spectrometer and Perkin–Elmer-make FTIR spectrophotometer. Finally, the electrical property, photovoltaic current–voltage (PVIV)
nature, was analyzed using under simulated standard sunlight (100 mW/cm
2 , AM
1.5G) (model: 2400 High Current Source Meter, Keithley) (Compact 150W Solar
Simulator, Zolix Instruments, China).
3 Results and Discussion
3.1 XRD Analysis
Figure 1 indicates the XRD pattern of TiO 2 coupled with PLT15 that was found to
be similar in accordance with the reported literature (Dey et al. 2017b). From the
XRD pattern, it is prominent that the presence of different planes has been identified
having specification of (1 0 0), (1 1 0), (1 1 1), (2 1 0) for dielectric material.
Fig. 1 X-ray diffraction
patterns of TiO 2 coupled
with dielectric material
PLT15
10
20
30
40
50
60
1000
2000
3000
4000
5000
6000
7000
$ (210)
$ (111)
$ (110)
$ (100)
# (213)
# (105)
# (200)
# (103)
Intensity (a.u.)
2 Theta (degree)
# (101)
# TiO 2
$ PLT 15
A. Dey et al.
The spiro-OMeTAD (Sigma-Aldrich, 99%) was used as electrolyte and conductive
silver paste was used as counter electrode.
2.5 Characterization of Materials and Solar Cells
X-ray diffraction (XRD, Ultima III, Rigaku, Japan) with Cu Kα radiation was
used for analyzing the crystal structure of the sample. For estimating the morphological characteristics, scanning electron microscopy (model: EVO 18 Special
Edition, ZEISS make) was used. The absorption characteristics were analyzed
using a HITACHI-make UV/vis spectrometer and Perkin–Elmer-make FTIR spectrophotometer. Finally, the electrical property, photovoltaic current–voltage (PVIV)
nature, was analyzed using under simulated standard sunlight (100 mW/cm
2 , AM
1.5G) (model: 2400 High Current Source Meter, Keithley) (Compact 150W Solar
Simulator, Zolix Instruments, China).
3 Results and Discussion
3.1 XRD Analysis
Figure 1 indicates the XRD pattern of TiO 2 coupled with PLT15 that was found to
be similar in accordance with the reported literature (Dey et al. 2017b). From the
XRD pattern, it is prominent that the presence of different planes has been identified
having specification of (1 0 0), (1 1 0), (1 1 1), (2 1 0) for dielectric material.
Fig. 1 X-ray diffraction
patterns of TiO 2 coupled
with dielectric material
PLT15
10
20
30
40
50
60
1000
2000
3000
4000
5000
6000
7000
$ (210)
$ (111)
$ (110)
$ (100)
# (213)
# (105)
# (200)
# (103)
Intensity (a.u.)
2 Theta (degree)
# (101)
# TiO 2
$ PLT 15