3.1 Thermodynamic Analysis of Physical Anti-Collision …
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3.1.2 Design of the Experimentation System
(1) Temperature control system
The temperature control system is designed as Fig. 3.2, in which a temperature
controller is adapted to measure and control surrounding temperature [13–15]. The
system is devised to simulate the influence of temperature on the dynamic reading
performance of the UHF RFID system. Figure 3.2a shows the schematic of the
temperature control system, Fig. 3.2b shows the real graph and Fig. 3.2c displays the
whole schematic diagram of the dynamic test.
A tag is attached to the inner wall of the plastic box. The tag identification rate
influenced by the plastic box could be ignored due to the low dielectric constant. A
temperature probe hangs inside the plastic box. Simultaneously, some semiconductor
heaters are placed at the bottom of the plastic box and connected with a temperature
controller outside the plastic box.
First, setting the temperature of the temperature controller, the semiconductor
heaters/coolers heat/cool the surrounding temperature inside the plastic box. Second,
once the internal temperature reaches the set value, the temperature controller stops
supplying power to the semiconductor heaters/coolers.
A temperature controller based on thermoelectric cooler (TEC) was designed here
to realize the monitoring of environmental temperature. So the tag identification
performance influenced by environmental temperature could be studied.
Fig. 3.2 Diagram of temperature control system (color online)
65
3.1.2 Design of the Experimentation System
(1) Temperature control system
The temperature control system is designed as Fig. 3.2, in which a temperature
controller is adapted to measure and control surrounding temperature [13–15]. The
system is devised to simulate the influence of temperature on the dynamic reading
performance of the UHF RFID system. Figure 3.2a shows the schematic of the
temperature control system, Fig. 3.2b shows the real graph and Fig. 3.2c displays the
whole schematic diagram of the dynamic test.
A tag is attached to the inner wall of the plastic box. The tag identification rate
influenced by the plastic box could be ignored due to the low dielectric constant. A
temperature probe hangs inside the plastic box. Simultaneously, some semiconductor
heaters are placed at the bottom of the plastic box and connected with a temperature
controller outside the plastic box.
First, setting the temperature of the temperature controller, the semiconductor
heaters/coolers heat/cool the surrounding temperature inside the plastic box. Second,
once the internal temperature reaches the set value, the temperature controller stops
supplying power to the semiconductor heaters/coolers.
A temperature controller based on thermoelectric cooler (TEC) was designed here
to realize the monitoring of environmental temperature. So the tag identification
performance influenced by environmental temperature could be studied.
Fig. 3.2 Diagram of temperature control system (color online)