Index
535
double-templating method, 398–400
dual template method, 406, 408
micelle template, 408
nanochannel template, 362, 365, 366,
368, 371, 380, 384
opal template, 389
Tenside, 171, 229, 230, 268, 410
Tensile stress, 161, 163, 196, 198, 199, 201
Texture, 34, 35, 43, 45, 58, 61, 62, 137, 158,
194, 204, 240, 277, 279, 375
Thermoelectricity, 137, 336, 371, 379
Thermogravimetry (TG), 67
Thin-layer, 430, 433
Thin-layer cell, 81, 140, 150, 388, 423–425,
428, 429, 434, 435, 438, 439
Thin-layer electrochemical cells, 423
Three-phase boundary, 428
Three-phase boundary line, 447, 450
Tip-assisted deposition, 456
Tip-assisted nanopatterning, 454
Tip-Based Nanomanufacturing (TBN), 337
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS), 496
Transmission electron micrograph, 484
Transmission Electron Microscopy (TEM),
4, 60, 61, 107, 135–137, 153, 159,
162, 164, 189, 191, 199, 221, 223,
305, 313, 316, 347, 349, 402, 403,
407–409, 431–434, 436, 438, 445,
485, 513, 520, 521
Transpassive dissolution, 51
Transport rate modulation, 150
Triblock copolymer, 409
Tribological behaviour, 163
Tribology, 70, 163
Triple junction, 187, 259
Triple-phase boundary line, 442
Triple-phase boundary zone, 448
Triple-phase junction, 448
Tunnelling Ultramicroelectrode (TUME),
467
Two-pulse plating, 110, 141, 149, 157, 163,
165, 374
U
Ultra-Large-Scale Integration (ULSI), 109
Ultramicroelectrode, 466, 467
Ultramicroscope, 3
Ultrasonic agitation or Ultrasonication, 151,
229, 230, 236, 245
Ultrathin layers, 107, 109, 112, 119–121,
152
Ultraviolet Photoelectron Spectroscopy
(UPS), 57
Underpotential Deposition (UPD), 39–41,
82–86, 88, 90, 94, 96–103, 105–107,
110, 113, 117, 118, 140, 263, 348,
403, 411, 457–459
Uniform Injection Cell (UIC), 150
V
Van der Waals-force, 228, 229
Vegard law, 158, 224
Vicker’s hardness (HV), 69
Volmer–Weber type nucleation, 36–38, 112,
323, 326, 337
W
Wavelength-Dispersive X-ray Spectroscopy
(WDS), 60, 66
Wear damage/loss, 190, 201, 243, 244
Wear resistance, 71, 161, 163, 199, 203, 210,
241, 243, 244, 250
Wear tests, 68, 70, 71
Wenzel state, 267
Wetting agent, 259
Wetting angle, 267
Williamson–Hall method, 64, 189
Working electrode, 19, 21, 22, 35, 52, 81, 83,
90, 110, 121, 261
X
X-ray Absorption Near-Edge Structure
(XANES), 58, 59
X-ray Diffractometry (XRD), 58, 136, 140,
158, 160, 161, 189, 191, 194, 196,
199, 209, 210, 218, 220, 221, 223,
224, 226, 275, 313, 316, 402, 406,
431
grazing incidence mode, 119
powder diffraction, 63, 64
satellite peaks, 159, 160
single crystal diffraction, 63, 64
X-ray Fluorescence (XRF), 58, 66
X-ray microscopy, 433
X-ray Photoelectron Spectroscopy (XPS),
58, 66, 67, 90, 270, 271, 275, 289,
311, 349
X-ray reflectometry, 58
X-ray tomography, 59
Y
Young state, 267
535
double-templating method, 398–400
dual template method, 406, 408
micelle template, 408
nanochannel template, 362, 365, 366,
368, 371, 380, 384
opal template, 389
Tenside, 171, 229, 230, 268, 410
Tensile stress, 161, 163, 196, 198, 199, 201
Texture, 34, 35, 43, 45, 58, 61, 62, 137, 158,
194, 204, 240, 277, 279, 375
Thermoelectricity, 137, 336, 371, 379
Thermogravimetry (TG), 67
Thin-layer, 430, 433
Thin-layer cell, 81, 140, 150, 388, 423–425,
428, 429, 434, 435, 438, 439
Thin-layer electrochemical cells, 423
Three-phase boundary, 428
Three-phase boundary line, 447, 450
Tip-assisted deposition, 456
Tip-assisted nanopatterning, 454
Tip-Based Nanomanufacturing (TBN), 337
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS), 496
Transmission electron micrograph, 484
Transmission Electron Microscopy (TEM),
4, 60, 61, 107, 135–137, 153, 159,
162, 164, 189, 191, 199, 221, 223,
305, 313, 316, 347, 349, 402, 403,
407–409, 431–434, 436, 438, 445,
485, 513, 520, 521
Transpassive dissolution, 51
Transport rate modulation, 150
Triblock copolymer, 409
Tribological behaviour, 163
Tribology, 70, 163
Triple junction, 187, 259
Triple-phase boundary line, 442
Triple-phase boundary zone, 448
Triple-phase junction, 448
Tunnelling Ultramicroelectrode (TUME),
467
Two-pulse plating, 110, 141, 149, 157, 163,
165, 374
U
Ultra-Large-Scale Integration (ULSI), 109
Ultramicroelectrode, 466, 467
Ultramicroscope, 3
Ultrasonic agitation or Ultrasonication, 151,
229, 230, 236, 245
Ultrathin layers, 107, 109, 112, 119–121,
152
Ultraviolet Photoelectron Spectroscopy
(UPS), 57
Underpotential Deposition (UPD), 39–41,
82–86, 88, 90, 94, 96–103, 105–107,
110, 113, 117, 118, 140, 263, 348,
403, 411, 457–459
Uniform Injection Cell (UIC), 150
V
Van der Waals-force, 228, 229
Vegard law, 158, 224
Vicker’s hardness (HV), 69
Volmer–Weber type nucleation, 36–38, 112,
323, 326, 337
W
Wavelength-Dispersive X-ray Spectroscopy
(WDS), 60, 66
Wear damage/loss, 190, 201, 243, 244
Wear resistance, 71, 161, 163, 199, 203, 210,
241, 243, 244, 250
Wear tests, 68, 70, 71
Wenzel state, 267
Wetting agent, 259
Wetting angle, 267
Williamson–Hall method, 64, 189
Working electrode, 19, 21, 22, 35, 52, 81, 83,
90, 110, 121, 261
X
X-ray Absorption Near-Edge Structure
(XANES), 58, 59
X-ray Diffractometry (XRD), 58, 136, 140,
158, 160, 161, 189, 191, 194, 196,
199, 209, 210, 218, 220, 221, 223,
224, 226, 275, 313, 316, 402, 406,
431
grazing incidence mode, 119
powder diffraction, 63, 64
satellite peaks, 159, 160
single crystal diffraction, 63, 64
X-ray Fluorescence (XRF), 58, 66
X-ray microscopy, 433
X-ray Photoelectron Spectroscopy (XPS),
58, 66, 67, 90, 270, 271, 275, 289,
311, 349
X-ray reflectometry, 58
X-ray tomography, 59
Y
Young state, 267
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