11 Electron Tomography
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11.3.3 Future Perspectives. Clustering Data in EELS-SV
Tomographic Reconstructions
The potential benefits arising from the joint performance of new ET algorithms
and better segmentation procedures are manifold: to overcome the problems arising
from low acquisition times, few projections or reduced pixel time. This will lead
to better EELS-SV reconstructions with a higher degree of complexity (ELNES
analysis included), and in otherwise non-treatable cases (e.g. samples susceptible
to beam damage). In this sense, systematic approaches have been recently reported,
applying wavelet transform [28, 52] to reduce the incidence of Poissonian noise [53,
54] in HAADF images previous to the 3D reconstruction via TMV-algorithm [55,
56]. The same method is likely to be implemented in EELS-SV reconstruction, given
the unavoidable Poissonian noise present in EELS due to the signal nature.
The recently introduced clustering approach for the EELS-SI segmentation is still
to be tested on EELS-SV reconstructions. In principle, given the physical nature of
the components extracted from cluster analysis, they should be a valid signal in most
ET algorithms, whereas no thickness-related artefacts break the projection requirement. A systematic study on the accuracy of the EELS-SV reconstruction, using
different algorithms, under different acquisition conditions and including clustering
segmentation techniques, needs to be addressed shortly. Also, an in-depth study of the
suitability of the wide variety of clustering algorithms available (e.g. the described
HAC, K-means [48] and agglomerative clustering [57], among others) applied to
EELS data treatment must be also undertaken.
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