4.2 Utilizing Electron Emission Spectroscopy
85
Pt
Pt 4f
Cu 2p
Secondary electron image
Secondary electron (zero bias)
Pt > Cu
Pt
Cu
0V
1480 1475 1470 1465
Binding Energy (eV)
c/s
4
3
2
1
0
X 10 4
Cu > Pt
Secondary electron (-4 V bias)
Cu
Imaging with intensity
at this energy
Pt
Cu
-4V
c/s
4
3
2
1
0
X 10 4
1482 1482 1478 1476 1474 1472
Binding Energy (eV)
intensity
for mapping
Fig. 4.16 Photoelectron images and secondary electron images with/without bias on specimens
patterned with Pt and Cu [10] (see text for explanation)