Multilayer adsorption, 235f, 240
Multilayer formation, polyelectrolytes, 395–396
Multipoles, defined, 140
N
Nanoantenna, ring, size of, 120–121
Nanoassemblies, 335
Nanocars, 337
electrically driven, 337, 338f
Nanofabrication, defined, 5–6
Nanofilm, absorption of visible light by, 192–194
Nanofilm, thickness measurement, 265; see also
Ellipsometry
dual-polarized interferometry, 284–290
application, 289–290
principles of, 287–290, 289f
transverse electric (TE) mode, 287–288
transverse magnetic (TM) polarized mode,
287–288
waveguide basics, 284–285, 285f
waveguide interferometry, effective refractive
index and, 285–287, 286f
optical parameters Del (Δ) and Psi (y),
273–274
reflection phenomena at interfaces, 278–280
evanescent waves, 279–280
total internal reflection, 278–279
surface plasmon resonance, 280–284
instrument setup, 282–284, 282f
principles, 280–282, 281f
Nanoframeworks, 378–379, 379f
Nanoimaging methods, 308–329
imaging ellipsometry
conventional ellipsometry, 308
ellipsometric data extraction methods, 309
image focusing, 310
modern, principles, 308–309
resolution for imaging ellipsometer, 310–311,
310f
near-field scanning optical microscopy, 323–329
history and principles, 324
modern instrumentation and different operating
modes, 324–329, 325f–328f
scanning probe methods
atomic force microscopy, 315–317, 315f, 316f
scanning tunneling microscopy, 311–314, 312f,
314f
transmission electron microscopy, 317–323
instrumentation, 321–323, 321f
principles, 319–321
Nanoinjectors, AFM tip, 317, 318f
Nano Letters, 4, 337
Nanolithography, 369, 413
dip-pen, 418–419
Nanomaterials
bulk characterization techniques, see Bulk
characterization techniques
quantum confinement in, 96
superhydrophobic surfaces and, 225–230
Nanomaterials, functional, 335–379
carbon nanotubes, 370–376
catalyst-induced growth mechanism, 375–376, 375f
478 Index
Multilayer formation, polyelectrolytes, 395–396
Multipoles, defined, 140
N
Nanoantenna, ring, size of, 120–121
Nanoassemblies, 335
Nanocars, 337
electrically driven, 337, 338f
Nanofabrication, defined, 5–6
Nanofilm, absorption of visible light by, 192–194
Nanofilm, thickness measurement, 265; see also
Ellipsometry
dual-polarized interferometry, 284–290
application, 289–290
principles of, 287–290, 289f
transverse electric (TE) mode, 287–288
transverse magnetic (TM) polarized mode,
287–288
waveguide basics, 284–285, 285f
waveguide interferometry, effective refractive
index and, 285–287, 286f
optical parameters Del (Δ) and Psi (y),
273–274
reflection phenomena at interfaces, 278–280
evanescent waves, 279–280
total internal reflection, 278–279
surface plasmon resonance, 280–284
instrument setup, 282–284, 282f
principles, 280–282, 281f
Nanoframeworks, 378–379, 379f
Nanoimaging methods, 308–329
imaging ellipsometry
conventional ellipsometry, 308
ellipsometric data extraction methods, 309
image focusing, 310
modern, principles, 308–309
resolution for imaging ellipsometer, 310–311,
310f
near-field scanning optical microscopy, 323–329
history and principles, 324
modern instrumentation and different operating
modes, 324–329, 325f–328f
scanning probe methods
atomic force microscopy, 315–317, 315f, 316f
scanning tunneling microscopy, 311–314, 312f,
314f
transmission electron microscopy, 317–323
instrumentation, 321–323, 321f
principles, 319–321
Nanoinjectors, AFM tip, 317, 318f
Nano Letters, 4, 337
Nanolithography, 369, 413
dip-pen, 418–419
Nanomaterials
bulk characterization techniques, see Bulk
characterization techniques
quantum confinement in, 96
superhydrophobic surfaces and, 225–230
Nanomaterials, functional, 335–379
carbon nanotubes, 370–376
catalyst-induced growth mechanism, 375–376, 375f
478 Index