one-dimensional model, 104–113
classical limit, approaching, 109–110
freely moving electrons on nanowire, 111–112
Hamiltonian operator, 105, 107
line segment model, 108
normalization of wavefunction, 101, 106–109
particle-on-a-line model, 110
Pauli exclusion principle, 111
two- and three-dimensional models,
113–117, 118f
Electron transport, in nanowires, 367–368, 368f
Electro-optic coefficient, 429, 430
Electro-optic (EO) effect, 429–430
Electro-optics, organic-inorganic hybrid, 430–431,
430f, 432f
Mach–Zehnder electro-optic modulator, 430–431,
430f
plasmonic–organic hybrid modulator, 432
Electrophoresis, 369
Electrostatic forces, between surfaces, 156–162
Debye length, 159–160
electrical double layer, 157–159
interactions between charged surfaces in liquid,
160–162
overview, 156
Electrostatic self-assembly (ESA), 349
layer-by-layer (LbL) technique, 392
polyelectrolytes, 390–392, 391f, 392f, 393f
Ellipsometer, 275–277, 275f–276f, 278f
Ellipsometry, 259, 265–278
basic principles, 270–273
defined, 266
electromagnetic theory and polarized light, 266–270
ellipsometer, 275–277, 275–278, 275f–276f, 278f
imaging, 308–311
conventional, 308
conventional ellipsometry, 308
ellipsometric data extraction methods, 309
extracting ellipsometric data, 309
image focusing, 310
modern, principles, 308–309
principles, 308–309
resolution for imaging ellipsometer, 310–311, 310f
nanofilms thickness measurement
dual polarization interferometry, 284–290
optical parameters Del (Δ) and Psi (y), 273–274
reflection phenomena at interfaces, 278–280
surface plasmon resonance, 280–284
overview, 265–266
principles of, 270–273, 271f
principles of electromagnetic theory and polarized
light, 266–270, 267f–270f
refractive index (n), 270–271, 271f
thickness of films, optical parameters del (Δ)
and psi (Y), 273–274
Elliptically polarized light, 269–270, 277
Ellipticity, 270
Emmett Teller adsorption isotherm, 240
End-to-end arrangement, 175
Energy
activation, 76
Index 467