9 Mössbauer Spectroscopic Studies on Atomic Diffusion in Materials
515
85. K. Hayakawa, Y. Tsukamoto, Y. Akiyama, M. Kurata, K. Yukihira, H. Soejima, Y. Yoshida,
Deployment of system and technology for Mössbauer spectroscopic microscope. Hyperfine
Interact 206, 79–82 (2012)
86. Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai, K.
Moriguchi, Y. Harada, Y. Yoshida, 3D-Mössbauer spectroscopic microscope for mc-Si solar
cell evaluation. Hyperfine Interact. 237, 13 (2016)
87. Y. Yoshida, Y. Ino, K. Matsumuro, T. Watanabe, H. Fujita, K. Hayakawa, K. Yukihira, K.
Ogai, K. Moriguchi, Y. Harada, H. Soejima, Feasibility study to investigate the diffusion of
Fe in Si using a Mössbauer spectroscopic microscope. Hyperfine Interact. 237, 130 (2016)
88. Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, K. Matsumuro, H. Fujita, K. Ogai, K.
Moriguchi, Y. Harada, H., Soejima, Y. Yoshida, A new set-up of Mössbauer spectroscopic
microscope to study the correlation between Fe impurities and lattice defects in Si crystals.
J. Cryst Growth. https://doi.org/10.1016/j.jcrysgro.2016.12.109
89. Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai,
K. Moriguchi, Y. Harada, and Y. Yoshida, 3D-mössbauer spectroscopic microscope for mc-Si
solar cell evaluation. Hyperfine Interactions. 237, 13 (2016).
90. Y. Yoshida, T. Watanabe, Y. Ino, M. Kobayashi, I. Takahashi, N. Usami, Mössbauer spectroscopic microscopy study on diffusion and segregation of Fe impurities in mc-si wafer.
Hyperfine Interact. 240, 114–121 (2019)
91. G. Langouche, Y. Yoshida, Ion Implantation, in Mössbauer Spectroscopy-Tutorial Book, eds.
by Y. Yoshida, G. Langouche (Springer, 2013). https://doi.org/10.1007/978-3-642-32220-4
92. G. Langouche, Y. Yoshida, Nuclear Methods to study defects and impurities in Si materials. 10.1007/978-4-431-55800-2, pp. 373, Chapter 8, in Defects and Impurities in Silicon
Materials- An Introduction to Atomic-Level Silicon Engineering, eds. by Y. Yoshida, G.
Langouche (eds.), in Lecture Note in Physics, (Springer, Berlin, 2016)
93. H.P. Gunnlaugsson, G. Weyer, M. Dietrich, M. Fanciulli, K. Bharuth-Ram, R. Sielemann,
ISOLDE collaboration. Appl. Phys. Lett. 80, 2657–2659 (2002)
94. J. Kübler, A.E. Kumm, H. Overhof, P. Schwalbach, M. Hartick, E. Kankeleit, B. Keck,
L. Wende, R. Sielemann, Isomer-shift of interstitial and substitutional iron in silicon and
germanium. Z. Phys. B 92, 155–162 (1993)
95. E. Wright, J. Coutinho, S. Oberg, V.J.B. Torres, J. Appl. Phys. 119, 181509 (2016). https://
doi.org/10.1063/1.14948243
96. Y. Ino, K. Hayakawa, K. Yukihira, K. Moriguchi, K. Ogai, K. Shirasawa, H. Takato, Y. Yoshida,
Iron contamination near surface of silicon solar cells observed by Mössbauer spectroscopic
microscope, under preparation for publication, (2020)
97. M. Kobayashi, Y. Yoshida, in Abstract book for The 9th TOYOTA RIKEN International
Workshop on New Developments and Prospects for the Future of Mössbauer Spectroscopy
(IWMS2018)
98. N. Maruyama, H. Fujita, M. Kobayashi, Y. Yoshida, H. Kubo, Mössbauer and atom probe
tomography characterization of low and medium carbon martensitic steels, in Abstract book
for The 9th TOYOTA RIKEN International Workshop on New Developments and Prospects
for the Future of Mössbauer Spectroscopy (IWMS2018)
99. K. Tanaka, Y. Tsukamoto, K. Hayakawa, Y. Yoshida, Characterization of 57 Fe-Enriched
BiFeO 3 thin films by mössbauer spectroscopy. Jpn. J. Appl. Phys. 51, (2012)
100. K. Tanaka, Y. Tsukamoto, S. Okamura, Y. Yoshida, Observation of 57 Fe-Enriched BiFeO 3
thin films by Mössbauer spectroscopic microscope. Jpn. J. Appl. Phys. 52, 09KB02 (2013)
101. K. Tanaka, Y. Tsukamoto, S. Okamura, Y. Yoshida, Mössbauer spectra of 57 Fe-Enriched
BiFeO 3 thin films fabricated on SiO 2 /Si substrates by chemical solution deposition process.
Key Eng. Mater. 582, 63–66 (2014)
102. K. Tanaka, Y. Fujita, S. Okamura, Y. Yoshida, Mössbauer spectra and electric properties of
57 Fe-enriched BiFeO 3 Thin Films. Jpn. J. Appl. Phys. 53 (2014)
515
85. K. Hayakawa, Y. Tsukamoto, Y. Akiyama, M. Kurata, K. Yukihira, H. Soejima, Y. Yoshida,
Deployment of system and technology for Mössbauer spectroscopic microscope. Hyperfine
Interact 206, 79–82 (2012)
86. Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai, K.
Moriguchi, Y. Harada, Y. Yoshida, 3D-Mössbauer spectroscopic microscope for mc-Si solar
cell evaluation. Hyperfine Interact. 237, 13 (2016)
87. Y. Yoshida, Y. Ino, K. Matsumuro, T. Watanabe, H. Fujita, K. Hayakawa, K. Yukihira, K.
Ogai, K. Moriguchi, Y. Harada, H. Soejima, Feasibility study to investigate the diffusion of
Fe in Si using a Mössbauer spectroscopic microscope. Hyperfine Interact. 237, 130 (2016)
88. Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, K. Matsumuro, H. Fujita, K. Ogai, K.
Moriguchi, Y. Harada, H., Soejima, Y. Yoshida, A new set-up of Mössbauer spectroscopic
microscope to study the correlation between Fe impurities and lattice defects in Si crystals.
J. Cryst Growth. https://doi.org/10.1016/j.jcrysgro.2016.12.109
89. Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai,
K. Moriguchi, Y. Harada, and Y. Yoshida, 3D-mössbauer spectroscopic microscope for mc-Si
solar cell evaluation. Hyperfine Interactions. 237, 13 (2016).
90. Y. Yoshida, T. Watanabe, Y. Ino, M. Kobayashi, I. Takahashi, N. Usami, Mössbauer spectroscopic microscopy study on diffusion and segregation of Fe impurities in mc-si wafer.
Hyperfine Interact. 240, 114–121 (2019)
91. G. Langouche, Y. Yoshida, Ion Implantation, in Mössbauer Spectroscopy-Tutorial Book, eds.
by Y. Yoshida, G. Langouche (Springer, 2013). https://doi.org/10.1007/978-3-642-32220-4
92. G. Langouche, Y. Yoshida, Nuclear Methods to study defects and impurities in Si materials. 10.1007/978-4-431-55800-2, pp. 373, Chapter 8, in Defects and Impurities in Silicon
Materials- An Introduction to Atomic-Level Silicon Engineering, eds. by Y. Yoshida, G.
Langouche (eds.), in Lecture Note in Physics, (Springer, Berlin, 2016)
93. H.P. Gunnlaugsson, G. Weyer, M. Dietrich, M. Fanciulli, K. Bharuth-Ram, R. Sielemann,
ISOLDE collaboration. Appl. Phys. Lett. 80, 2657–2659 (2002)
94. J. Kübler, A.E. Kumm, H. Overhof, P. Schwalbach, M. Hartick, E. Kankeleit, B. Keck,
L. Wende, R. Sielemann, Isomer-shift of interstitial and substitutional iron in silicon and
germanium. Z. Phys. B 92, 155–162 (1993)
95. E. Wright, J. Coutinho, S. Oberg, V.J.B. Torres, J. Appl. Phys. 119, 181509 (2016). https://
doi.org/10.1063/1.14948243
96. Y. Ino, K. Hayakawa, K. Yukihira, K. Moriguchi, K. Ogai, K. Shirasawa, H. Takato, Y. Yoshida,
Iron contamination near surface of silicon solar cells observed by Mössbauer spectroscopic
microscope, under preparation for publication, (2020)
97. M. Kobayashi, Y. Yoshida, in Abstract book for The 9th TOYOTA RIKEN International
Workshop on New Developments and Prospects for the Future of Mössbauer Spectroscopy
(IWMS2018)
98. N. Maruyama, H. Fujita, M. Kobayashi, Y. Yoshida, H. Kubo, Mössbauer and atom probe
tomography characterization of low and medium carbon martensitic steels, in Abstract book
for The 9th TOYOTA RIKEN International Workshop on New Developments and Prospects
for the Future of Mössbauer Spectroscopy (IWMS2018)
99. K. Tanaka, Y. Tsukamoto, K. Hayakawa, Y. Yoshida, Characterization of 57 Fe-Enriched
BiFeO 3 thin films by mössbauer spectroscopy. Jpn. J. Appl. Phys. 51, (2012)
100. K. Tanaka, Y. Tsukamoto, S. Okamura, Y. Yoshida, Observation of 57 Fe-Enriched BiFeO 3
thin films by Mössbauer spectroscopic microscope. Jpn. J. Appl. Phys. 52, 09KB02 (2013)
101. K. Tanaka, Y. Tsukamoto, S. Okamura, Y. Yoshida, Mössbauer spectra of 57 Fe-Enriched
BiFeO 3 thin films fabricated on SiO 2 /Si substrates by chemical solution deposition process.
Key Eng. Mater. 582, 63–66 (2014)
102. K. Tanaka, Y. Fujita, S. Okamura, Y. Yoshida, Mössbauer spectra and electric properties of
57 Fe-enriched BiFeO 3 Thin Films. Jpn. J. Appl. Phys. 53 (2014)