been selected. For the measurement techniques part, the large number of publications will allow the reader to refer to a more complete and detailed technical
documentation.
Meudon, France
Bruno Chanetz
Meudon, France
Jean Délery
Paris, France
Patrick Gilliéron
Saint-Louis, France
Patrick Gnemmi
Toulouse, France
Erwin R. Gowree
Paris, France
Philippe Perrier
Preface
xi