7.8 Methods for Controlling Safety …
713
Hardware
metering
Passive
Active
Non-functional
identification
Functional identification
Combinational or
sequential intrinsic
control
Combinational or
sequential intrinsic
control
Reproducible
Uncloneable
Analog
Analog
Digital
Digital
Reproducible identifiers
Reproducible identifiers
Reproducible identifiers
Uncloneable identifiers
Uncloneable identifiers
Uncloneable identifiers
Fig. 7.25 Classification of hardware metering methods [116]
therefore cannot be used as a possible instrument (countermeasure) to influence the
production. Moreover, they can be non-reproducible for general customers, who can
assess these fuses only through decapsulation and invasive probing of chips.
Figure 7.25 shows an attempt to classify all hardware metering methods known at
the moment of publication of this book. Below we will try to take a look at the main
known mechanisms and structures used for active and passive methods of hardware
metering. For passive metering methods, we will examine the features of functional
identification, using the materials of [116].
Due to limited volume of our book, we are not going to consider the specific
features of non-functional chip identification methods. We can advise the readers
interested in these methods to refer to the book published in Springer publishing
house in 2011, which covers this subject to the fullest extent [127].
7.8.3 Passive Measurements of Microcircuits
Significant progress in the field of passive microcircuit hardware metering occurred
after emergence of new methods of the so-called functional identification of chips.
One of the first such methods was based on creating a special control channel for
each chip characterized by each separate chip on the wafter having its specific control
path. The biggest problem here is the production of unique chips manufactured in
mass production with absolutely identical masks and the same original topology
713
Hardware
metering
Passive
Active
Non-functional
identification
Functional identification
Combinational or
sequential intrinsic
control
Combinational or
sequential intrinsic
control
Reproducible
Uncloneable
Analog
Analog
Digital
Digital
Reproducible identifiers
Reproducible identifiers
Reproducible identifiers
Uncloneable identifiers
Uncloneable identifiers
Uncloneable identifiers
Fig. 7.25 Classification of hardware metering methods [116]
therefore cannot be used as a possible instrument (countermeasure) to influence the
production. Moreover, they can be non-reproducible for general customers, who can
assess these fuses only through decapsulation and invasive probing of chips.
Figure 7.25 shows an attempt to classify all hardware metering methods known at
the moment of publication of this book. Below we will try to take a look at the main
known mechanisms and structures used for active and passive methods of hardware
metering. For passive metering methods, we will examine the features of functional
identification, using the materials of [116].
Due to limited volume of our book, we are not going to consider the specific
features of non-functional chip identification methods. We can advise the readers
interested in these methods to refer to the book published in Springer publishing
house in 2011, which covers this subject to the fullest extent [127].
7.8.3 Passive Measurements of Microcircuits
Significant progress in the field of passive microcircuit hardware metering occurred
after emergence of new methods of the so-called functional identification of chips.
One of the first such methods was based on creating a special control channel for
each chip characterized by each separate chip on the wafter having its specific control
path. The biggest problem here is the production of unique chips manufactured in
mass production with absolutely identical masks and the same original topology