1 X-Ray Birefringence Imaging (XBI): A New Technique …
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Fig. 1.6 XBI data recorded for a single crystal of BrCH/thiourea in the LT phase (at 20 K) as a
function of χ (with φ fixed at φ = 0°). Maximum brightness (for the large central domain of the
crystal) arises when the C–Br bonds form an angle of 45° with respect to the direction of linear
polarization (horizontal) of the incident X-ray beam, which is achieved for the crystal orientation
χ ≈ 82°. Minimum brightness arises when the C–Br bonds form an angle of 90° with respect to
the horizontal direction, which is achieved for the crystal orientation χ ≈ 38°
no change in the size and spatial distribution of the domain structure as temperature
is varied within the LT phase.
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Fig. 1.6 XBI data recorded for a single crystal of BrCH/thiourea in the LT phase (at 20 K) as a
function of χ (with φ fixed at φ = 0°). Maximum brightness (for the large central domain of the
crystal) arises when the C–Br bonds form an angle of 45° with respect to the direction of linear
polarization (horizontal) of the incident X-ray beam, which is achieved for the crystal orientation
χ ≈ 82°. Minimum brightness arises when the C–Br bonds form an angle of 90° with respect to
the horizontal direction, which is achieved for the crystal orientation χ ≈ 38°
no change in the size and spatial distribution of the domain structure as temperature
is varied within the LT phase.