Relation Bit Mask
\
010
110
[
001
101
¼
100
6 ¼
011
References
1. Schagaev I (2008) Reliability of malfunction tolerance. In: International multi-conference on
computer science and information technology, IMCSIT 2008, Oct 20–22, pp 733–737
2. Blaeser L, Monkman S, Schagaev I (2014) Evolving systems. In: Proceedings of World
Comp’14, USA, July 14. https://www.academia.edu/7685575/Evolving_systems_World
Comp_2014
3. Castano V, Schagaev I Resilient computer system design. Springer ISBN 978-3-319-15069-7
4. Antola A, Er enyi I, Scarabottolo N (1986) Transient fault management in systems based on the
AMD2900 microprocessors. Microprocess Microprog 17(4):205–217
14.2 Instruction Set
205
\
010
110
[
001
101
¼
100
6 ¼
011
References
1. Schagaev I (2008) Reliability of malfunction tolerance. In: International multi-conference on
computer science and information technology, IMCSIT 2008, Oct 20–22, pp 733–737
2. Blaeser L, Monkman S, Schagaev I (2014) Evolving systems. In: Proceedings of World
Comp’14, USA, July 14. https://www.academia.edu/7685575/Evolving_systems_World
Comp_2014
3. Castano V, Schagaev I Resilient computer system design. Springer ISBN 978-3-319-15069-7
4. Antola A, Er enyi I, Scarabottolo N (1986) Transient fault management in systems based on the
AMD2900 microprocessors. Microprocess Microprog 17(4):205–217
14.2 Instruction Set
205