174
D. Hurley-Smith and J. Hernandez-Castro
Table 10.3 Dieharder results [289]
Test
Card 1
Card 2
Card 3
Birthday spacings
0.18194520
0.61105583
0.78263630
Overlapping permutations
0.38044164
0.58693289
0.44201308
32 × 32 Binary rank
0.42920693
0.23409500
0.55699838
6 × 8 Binary rank
0.31311490
0.32387215
0.66137580
Bitstream
0.97724174
0.18743536
0.59532464
Count the 1’s (stream)
0.17108396
0.74984724
0.87214241
Count the 1’s (byte)
0.65870385
0.01287807
0.00020194
Parking lot
0.18078043
0.24200626
0.38128677
Minimum distance (2d sphere)
0.76328000
0.95091635
0.34980807
3d sphere (minimum distance)
0.23871272
0.20826216
0.39340851
Squeeze
0.62598919
0.08843989
0.77057749
Runs
0.99778832
0.62043244
0.90550208
0.44719093
0.91228597
0.04870531
Craps
0.54077256
0.92769962
0.91803037
0.57614807
0.94245583
0.95209393
The bold values indicate those tests which fail, but such a degree that they are well outside the
bounds of confidence established by NIST (or in the case of Ent, our extrapolation of the NIST
SP800-22 confidence bound of a = 0.01)
Table 10.4 NIST SP800-22
results [289]
Test
Card 1
Card 2
Card 3
Frequency
198/200 200/200 197/200
Block frequency
196/200 199/200 194/200
Cumulative sums
2/2
2/2
2/2
Longest run
196/200 198/200 198/200
Rank
198/200 199/200 197/200
FFT
197/200 199/200 198/200
Non-overlapping template
147/148 148/148 148/148
Overlapping template
198/200 198/200 198/200
Universal
198/200 198/200 198/200
Approximate entropy
197/200 198/200 196/200
Random excursions
8/8
8/8
8/8
Random excursions variant 18/18
18/18
18/18
Serial
2/2
2/2
2/2
Linear complexity
199/200 197/200 199/200
The bold values indicate those tests which fail, but such a
degree that they are well outside the bounds of confidence
established by NIST (or in the case of Ent, our extrapolation
of the NIST SP800-22 confidence bound of a = 0.01)
Cards 1 and 3 both show some borderline results, notably in the Runs and Nonoverlapping template tests. However, the majority of cards (98 of 100) passed this
battery. This was a cause for concern: any failure is a cause for further investigation
as stated by SP800-90B. As a result, further analysis was deemed necessary, and the
D. Hurley-Smith and J. Hernandez-Castro
Table 10.3 Dieharder results [289]
Test
Card 1
Card 2
Card 3
Birthday spacings
0.18194520
0.61105583
0.78263630
Overlapping permutations
0.38044164
0.58693289
0.44201308
32 × 32 Binary rank
0.42920693
0.23409500
0.55699838
6 × 8 Binary rank
0.31311490
0.32387215
0.66137580
Bitstream
0.97724174
0.18743536
0.59532464
Count the 1’s (stream)
0.17108396
0.74984724
0.87214241
Count the 1’s (byte)
0.65870385
0.01287807
0.00020194
Parking lot
0.18078043
0.24200626
0.38128677
Minimum distance (2d sphere)
0.76328000
0.95091635
0.34980807
3d sphere (minimum distance)
0.23871272
0.20826216
0.39340851
Squeeze
0.62598919
0.08843989
0.77057749
Runs
0.99778832
0.62043244
0.90550208
0.44719093
0.91228597
0.04870531
Craps
0.54077256
0.92769962
0.91803037
0.57614807
0.94245583
0.95209393
The bold values indicate those tests which fail, but such a degree that they are well outside the
bounds of confidence established by NIST (or in the case of Ent, our extrapolation of the NIST
SP800-22 confidence bound of a = 0.01)
Table 10.4 NIST SP800-22
results [289]
Test
Card 1
Card 2
Card 3
Frequency
198/200 200/200 197/200
Block frequency
196/200 199/200 194/200
Cumulative sums
2/2
2/2
2/2
Longest run
196/200 198/200 198/200
Rank
198/200 199/200 197/200
FFT
197/200 199/200 198/200
Non-overlapping template
147/148 148/148 148/148
Overlapping template
198/200 198/200 198/200
Universal
198/200 198/200 198/200
Approximate entropy
197/200 198/200 196/200
Random excursions
8/8
8/8
8/8
Random excursions variant 18/18
18/18
18/18
Serial
2/2
2/2
2/2
Linear complexity
199/200 197/200 199/200
The bold values indicate those tests which fail, but such a
degree that they are well outside the bounds of confidence
established by NIST (or in the case of Ent, our extrapolation
of the NIST SP800-22 confidence bound of a = 0.01)
Cards 1 and 3 both show some borderline results, notably in the Runs and Nonoverlapping template tests. However, the majority of cards (98 of 100) passed this
battery. This was a cause for concern: any failure is a cause for further investigation
as stated by SP800-90B. As a result, further analysis was deemed necessary, and the