142
6 Atomic Chains, Clusters, and Nanocrystals
133. S. Suzer, H. Sezen, G. Ertas, A. Dana, XPS measurements for probing dynamics of charging.
J. Electron Spectrosc. Relat. Phenom. 176(1–3), 52–57 (2010)
134. S. Suzer, E. Abelev, S.L. Bernasek, Impedance-type measurements using XPS. Appl. Surf.
Sci. 256(5), 1296–1298 (2009)
135. H. Sezen, S. Suzer, Communication: enhancement of dopant dependent X-ray photoelectron
spectroscopy peak shifts of Si by surface photovoltage. J. Chem. Phys. 135(14), 141102 (2011)
136. Y. Guo, M. Bo, Y. Wang, Y. Liu, Y. Huang, C. Q. Sun, Atomistic bond relaxation, energy
entrapment, and electron polarization of the Rb and Cs clusters (N ≤ 58). Phys. Chem. Chem.
Phys. 17(45), 30389–30397 (2015)
6 Atomic Chains, Clusters, and Nanocrystals
133. S. Suzer, H. Sezen, G. Ertas, A. Dana, XPS measurements for probing dynamics of charging.
J. Electron Spectrosc. Relat. Phenom. 176(1–3), 52–57 (2010)
134. S. Suzer, E. Abelev, S.L. Bernasek, Impedance-type measurements using XPS. Appl. Surf.
Sci. 256(5), 1296–1298 (2009)
135. H. Sezen, S. Suzer, Communication: enhancement of dopant dependent X-ray photoelectron
spectroscopy peak shifts of Si by surface photovoltage. J. Chem. Phys. 135(14), 141102 (2011)
136. Y. Guo, M. Bo, Y. Wang, Y. Liu, Y. Huang, C. Q. Sun, Atomistic bond relaxation, energy
entrapment, and electron polarization of the Rb and Cs clusters (N ≤ 58). Phys. Chem. Chem.
Phys. 17(45), 30389–30397 (2015)