482
V. Radeka
References
1. G. Knoll, Radiation Detection and Measurement, John Wiley & Sons (2000).
2. C. Grupen and B. Shwartz, Particle Detectors, 2nd edition, Cambridge University Press
(2009).
3. G. Lutz, Semiconductor Radiation Detectors, Springer-Verlag (1999).
4. H. Spieler, Semiconductor Detector Systems, Oxford University Press (2005).
5. I. Iniewski (ed.), Medical Imaging, John Wiley & Sons (2009).
6. D.M. Binkley, Tradeoffs and Optimization in Analog CMOS Design, John Wiley & Sons
(2008).
7. C.C. Enz, E.A. Vittoz, Charge-based MOS Transistor Modeling, John Wiley & Sons (2006).
8. E. Gatti, P.F. Manfredi, Processing the Signals from Solid-State Detectors in Elementary
Particle Physics, Rivista de Nuovo Cimento, 9(1) (1986).
9. V. Radeka, Low-Noise Techniques in Detectors, Annu. Rev. Nucl. Part. Sci. 38 (1988) 217.
10. G. De Geronimo, Low-Noise Electronics for Radiation Sensors. In: Medical Imaging, K.
Iniewski (ed.), John Wiley & Sons (2009) p. 127.
11. W. Shockley, Currents to Conductors Induced by a Moving Charge, J. Appl. Phys. 9 (Oct.
1938) 635.
12. S. Ramo, Currents Induced by Electron Motion, Proc. IRE 27(1939) 584-585.
13. E. Gatti, G. Padovini, V. Radeka, Signal Evaluation in Multielectrode Detectors by Means of a
Time Dependent Weighting Vector, Nucl. Instrum. Meth. 193 (1982) 651.
14. N.R. Campbell, Proc. Cambridge Philos. Soc. 15 (1909) 117.
15. P.N. Luke, Unipolar Charge Sensing with Coplanar Electrodes – Application to Semiconductor
Detectors, IEEE Trans. Nucl. Sci. 42 (1995) 207.
16. V. Radeka, 1/|f|Noise in Physical Measurements, IEEE Trans. Nucl. Sci. NS-16 (1969) 17.
17. C.M. Compagnoni et al., Statistical Model for Random Telegraph Noise in Flash Memories,
IEEE Trans. Electron Devices 55(1) (2008) 388.
18. K. Kandiah, M.O. Deighton, F.B. Whiting, A Physical Model for Random Telegraph Signal
Currents in Semiconductor Devices, J. Appl. Physics 86(2) (1989) 937.
19. P. van der Wel et al., Modeling Random Telegraph Noise Under Switched Bias Conditions
Using Cylostationary RTS Noise, IEEE Trans. Electron Devices 50(5) (2003) 1378.
20. A. Konczakowska, J. Cicshosz, A. Szewczyk, A New Method for RTS Noise of Semiconductor
Devices Identification, IEEE Trans. Instrum. Meas. 57(6) (2008) 1199.
21. L.K.J. Vandamme, F.N. Hooge, What Do We Certainly Know About 1/f Noise in MOST?, IEEE
Trans. Electron Devices 55(11) (2008) 3070.
22. R. Wilson, Noise in Ionization Chamber Pulse Amplifiers, Philos. Mag., Ser. 7 Vol. xli, Jan.
(1950) 66.
23. V. Radeka, Optimum Signal Processing for Pulse Amplitude Spectrometry in the Presence of
High-Rate Effects and Noise, IEEE Trans. Nucl. Sci. NS-15 (1968) 455.
24. M. Konrad, Detector Pulse Shaping for High Resolution Spectroscopy, IEEE Trans. Nucl. Sci.
NS-15 (1968) 268.
25. V. Radeka, Trapezoidal Filtering of Signals from Large Germanium Detectors at High Rates,
Nucl. Instrum. Meth. 99 (1972) 535.
26. S. Rescia, V. Radeka, unpublished notes.
27. G.R. Hopkinson, D.H. Lumb, Noise Reduction Techniques for CCD Image Sensors, J. Phys. E:
Sci. Instrum., 15 (1982) 1214.
28. E. Gatti et al., Suboptimal Filtering of 1/f Noise in Detector Charge Measurements, Nucl.
Instrum. Meth. A 297 (1990) 467.
29. V. Radeka, Semiconductor Position Sensitive Detectors, Nucl. Instrum. Meth., 226 (1984) 209.
30. V. Radeka, State of the Art of Low Noise Amplifiers for Semiconductor Radiation Detectors,
Proc. Int’l. Symposium on Nuclear Electronics, Versailles, 1968, Vol. 1 (1968) 46-1.
31. V. Radeka, Field Effect Transistors for Charge Amplifiers, IEEE Trans. Nucl. Sci. NS-20 (1973)
182; see also, V. Radeka, The Field-Effect Transistor – Its Characteristics and Applications,
IEEE Trans. Nucl. Sci. NS-11 (1964) 358.
V. Radeka
References
1. G. Knoll, Radiation Detection and Measurement, John Wiley & Sons (2000).
2. C. Grupen and B. Shwartz, Particle Detectors, 2nd edition, Cambridge University Press
(2009).
3. G. Lutz, Semiconductor Radiation Detectors, Springer-Verlag (1999).
4. H. Spieler, Semiconductor Detector Systems, Oxford University Press (2005).
5. I. Iniewski (ed.), Medical Imaging, John Wiley & Sons (2009).
6. D.M. Binkley, Tradeoffs and Optimization in Analog CMOS Design, John Wiley & Sons
(2008).
7. C.C. Enz, E.A. Vittoz, Charge-based MOS Transistor Modeling, John Wiley & Sons (2006).
8. E. Gatti, P.F. Manfredi, Processing the Signals from Solid-State Detectors in Elementary
Particle Physics, Rivista de Nuovo Cimento, 9(1) (1986).
9. V. Radeka, Low-Noise Techniques in Detectors, Annu. Rev. Nucl. Part. Sci. 38 (1988) 217.
10. G. De Geronimo, Low-Noise Electronics for Radiation Sensors. In: Medical Imaging, K.
Iniewski (ed.), John Wiley & Sons (2009) p. 127.
11. W. Shockley, Currents to Conductors Induced by a Moving Charge, J. Appl. Phys. 9 (Oct.
1938) 635.
12. S. Ramo, Currents Induced by Electron Motion, Proc. IRE 27(1939) 584-585.
13. E. Gatti, G. Padovini, V. Radeka, Signal Evaluation in Multielectrode Detectors by Means of a
Time Dependent Weighting Vector, Nucl. Instrum. Meth. 193 (1982) 651.
14. N.R. Campbell, Proc. Cambridge Philos. Soc. 15 (1909) 117.
15. P.N. Luke, Unipolar Charge Sensing with Coplanar Electrodes – Application to Semiconductor
Detectors, IEEE Trans. Nucl. Sci. 42 (1995) 207.
16. V. Radeka, 1/|f|Noise in Physical Measurements, IEEE Trans. Nucl. Sci. NS-16 (1969) 17.
17. C.M. Compagnoni et al., Statistical Model for Random Telegraph Noise in Flash Memories,
IEEE Trans. Electron Devices 55(1) (2008) 388.
18. K. Kandiah, M.O. Deighton, F.B. Whiting, A Physical Model for Random Telegraph Signal
Currents in Semiconductor Devices, J. Appl. Physics 86(2) (1989) 937.
19. P. van der Wel et al., Modeling Random Telegraph Noise Under Switched Bias Conditions
Using Cylostationary RTS Noise, IEEE Trans. Electron Devices 50(5) (2003) 1378.
20. A. Konczakowska, J. Cicshosz, A. Szewczyk, A New Method for RTS Noise of Semiconductor
Devices Identification, IEEE Trans. Instrum. Meas. 57(6) (2008) 1199.
21. L.K.J. Vandamme, F.N. Hooge, What Do We Certainly Know About 1/f Noise in MOST?, IEEE
Trans. Electron Devices 55(11) (2008) 3070.
22. R. Wilson, Noise in Ionization Chamber Pulse Amplifiers, Philos. Mag., Ser. 7 Vol. xli, Jan.
(1950) 66.
23. V. Radeka, Optimum Signal Processing for Pulse Amplitude Spectrometry in the Presence of
High-Rate Effects and Noise, IEEE Trans. Nucl. Sci. NS-15 (1968) 455.
24. M. Konrad, Detector Pulse Shaping for High Resolution Spectroscopy, IEEE Trans. Nucl. Sci.
NS-15 (1968) 268.
25. V. Radeka, Trapezoidal Filtering of Signals from Large Germanium Detectors at High Rates,
Nucl. Instrum. Meth. 99 (1972) 535.
26. S. Rescia, V. Radeka, unpublished notes.
27. G.R. Hopkinson, D.H. Lumb, Noise Reduction Techniques for CCD Image Sensors, J. Phys. E:
Sci. Instrum., 15 (1982) 1214.
28. E. Gatti et al., Suboptimal Filtering of 1/f Noise in Detector Charge Measurements, Nucl.
Instrum. Meth. A 297 (1990) 467.
29. V. Radeka, Semiconductor Position Sensitive Detectors, Nucl. Instrum. Meth., 226 (1984) 209.
30. V. Radeka, State of the Art of Low Noise Amplifiers for Semiconductor Radiation Detectors,
Proc. Int’l. Symposium on Nuclear Electronics, Versailles, 1968, Vol. 1 (1968) 46-1.
31. V. Radeka, Field Effect Transistors for Charge Amplifiers, IEEE Trans. Nucl. Sci. NS-20 (1973)
182; see also, V. Radeka, The Field-Effect Transistor – Its Characteristics and Applications,
IEEE Trans. Nucl. Sci. NS-11 (1964) 358.