5 Solid State Detectors
181
Fig. 5.42 55 Fe spectrum measured with a single circular (XEUS-type) DEPFET. A spectral
resolution of 131 eV has been obtained with room temperature operation and 6 μs Gaussian
shaping. The separately measured noise peak has a FWHM of 19 eV corresponding to an electronic
noise of 2.2 electrons r.m.s
Fig. 5.43 Circuit diagram of a DEPFET pixel detector with parallel row-wise readout of the drain
current
reading is a measure for the signal charge in the pixel cell. Alternatively to the
procedure described above, sources may be connected column wise and source
voltages measured instead of drain currents. Figure 5.44 shows the spectroscopic
quality reached with a 64 × 64 DEPFET matrix of 50 × 50 μm 2 pixels.
181
Fig. 5.42 55 Fe spectrum measured with a single circular (XEUS-type) DEPFET. A spectral
resolution of 131 eV has been obtained with room temperature operation and 6 μs Gaussian
shaping. The separately measured noise peak has a FWHM of 19 eV corresponding to an electronic
noise of 2.2 electrons r.m.s
Fig. 5.43 Circuit diagram of a DEPFET pixel detector with parallel row-wise readout of the drain
current
reading is a measure for the signal charge in the pixel cell. Alternatively to the
procedure described above, sources may be connected column wise and source
voltages measured instead of drain currents. Figure 5.44 shows the spectroscopic
quality reached with a 64 × 64 DEPFET matrix of 50 × 50 μm 2 pixels.