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In target analysis a data independent acquisition can be performed with single
ions, precursor ions or reactions set by the user before the experiments starts.
The classical selected ion monitoring (SIM) approach is a MS method, requiring
one analyzer and consisting in monitoring selected ions, one or more, of each analyte. It can be performed in low or high resolution mode. In SIM the analyzer is not
scanning but fixed so to acquire only the ions of interest (Fig. 3.8). As more than one
ion can be monitored, the analyzer “jumps” from one m/z value to the next. This
ensures high sensitivity but scarce selectivity as a given ion might be produced by
Fig. 3.7 Scheme of a MS and MS/MS data independent acquisition target analysis
Fig. 3.8 Scheme of MS scan mode in selected ion monitoring (SIM), and of MS/MS scan modes
in selected reaction monitoring (SRM) and parallel reaction monitoring (PRM). (Modified from
Ref. [30])
G. Giorgi
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