Spectroscopie d’électrons Auger
67
4.8 BIBLIOGRAPHIE
Générale
J.P. EBERHART, Analyse structurale et chimique des matériaux, Dunod, Paris, 2 e éd., 1989.
D. BRIGGS et M.P. SEAH, eds. Practical Surface Analysis – Auger and X – Ray Photoelectron Spectroscopy Chichester, vol. 1, John Wiley&Sons, 2 nd ed., 1990.
H.J. MATHIEU, Auger Electron Spectroscopy, in Surface Analysis – The Principal Techniques,
J.C. Vickerman, Editor, Chichester, 1997.
Références
[4.1] P. AUGER, J. Phys. Radium 6, 205, 1925.
[4.2] P. AUGER, Surf. Sci. 48, 1, 1975.
[4.3] J.P. LANGERON, J. Microsc. Spectrosc Electr. 13, 331, 1988.
[4.4] L.E. DAVIS, N.C. MAC DONALD, P.W. PALMBERG, G.E. RIACH et R.E. WEBER, Handbook of
Auger Electron Spectroscopy, 2 nd ed, Perkin Elmer Corp., Eden Prairie, 1976.
[4.5] D.M. SMITH et T.E. GALLON, J Phys. D: Appl. Phys. 7, 151, 1974.
[4.6] S. ICHIMURA et R. SHIMIZU, Surf. Sci. 112, 386, 1981.
[4.7] P. PALMBERG, Anal. Chem. 45, 549 A, 1973.
[4.8] G. LORANG, Le Vide 52, 34, 1996.
[4.9] International Standard Organisation/Technical Report, Surface Chemical Analysis – Depth
Profiling – Measurement of sputtered depth, ISO/TR 15969: 2001(E).
[4.10] H.J. MATHIEU, Thin Film and Depth Profile Analysis, in Topics in Current Physics,
H. Oechsner, ed., Springer, Berlin, p. 39, 1984.
[4.11] P. PALMBERG, dans Methods of Surface Analysis, A.W. Czanderna, ed., Amsterdam, Elsevier,
1975.
67
4.8 BIBLIOGRAPHIE
Générale
J.P. EBERHART, Analyse structurale et chimique des matériaux, Dunod, Paris, 2 e éd., 1989.
D. BRIGGS et M.P. SEAH, eds. Practical Surface Analysis – Auger and X – Ray Photoelectron Spectroscopy Chichester, vol. 1, John Wiley&Sons, 2 nd ed., 1990.
H.J. MATHIEU, Auger Electron Spectroscopy, in Surface Analysis – The Principal Techniques,
J.C. Vickerman, Editor, Chichester, 1997.
Références
[4.1] P. AUGER, J. Phys. Radium 6, 205, 1925.
[4.2] P. AUGER, Surf. Sci. 48, 1, 1975.
[4.3] J.P. LANGERON, J. Microsc. Spectrosc Electr. 13, 331, 1988.
[4.4] L.E. DAVIS, N.C. MAC DONALD, P.W. PALMBERG, G.E. RIACH et R.E. WEBER, Handbook of
Auger Electron Spectroscopy, 2 nd ed, Perkin Elmer Corp., Eden Prairie, 1976.
[4.5] D.M. SMITH et T.E. GALLON, J Phys. D: Appl. Phys. 7, 151, 1974.
[4.6] S. ICHIMURA et R. SHIMIZU, Surf. Sci. 112, 386, 1981.
[4.7] P. PALMBERG, Anal. Chem. 45, 549 A, 1973.
[4.8] G. LORANG, Le Vide 52, 34, 1996.
[4.9] International Standard Organisation/Technical Report, Surface Chemical Analysis – Depth
Profiling – Measurement of sputtered depth, ISO/TR 15969: 2001(E).
[4.10] H.J. MATHIEU, Thin Film and Depth Profile Analysis, in Topics in Current Physics,
H. Oechsner, ed., Springer, Berlin, p. 39, 1984.
[4.11] P. PALMBERG, dans Methods of Surface Analysis, A.W. Czanderna, ed., Amsterdam, Elsevier,
1975.