illustrates modifications of the gold surface by a thin layer of an inorganic oxide
(Fig. 2.9a) and a soft-matter film (Fig. 2.9b). This modification of the metal surface
changes the surface properties but maintains high reflectivity of metallic surfaces.
Deposition of thin films (thickness < 100 nm) of these materials on an IR
reflecting metal surface (e.g. gold) ensures the fulfillment of the surface selection
rule of IRRAS. Figure 2.10 shows MSEFS versus angle of incidence plots of the Au
surface and Au surface modified by silicon oxide films of different thickness [17]. A
modification of the Au surface with a thinner than 90 nm silica film gives ca. 3.5
times enhancement of the MSEFS on the metal surface (Fig. 2.10) [17]. These
substrates can be applied in IRRAS.
For the application in IRRAS, the thickness of titanium deposited on the Au
surface should not exceed 50 nm [42]. Silicate and titanium modified Au surfaces
were applied to study the composition, orientation and packing of lipid bialyers
[17, 42, 45] as well as self-assembled monolayers [43].
Fig. 2.9 Modification of the metal surface with (a) a thin inorganic oxide layer, (b) thin polymer
film for studies of organized molecular films by means of in situ IRRAS
0
2 0
4 0
6 0
8 0
0
1
2
3
4
0
2 0
4 0
6 0
8 0
0.00
0.05
0.10
0.15
0.20
0.25
MSEFS
i
/ degree
SiO 2 layer
thickness increase
MESFS
i
/ degree
Fig. 2.10 MSEFS of the electric field vector of the z-component (vertical) of the p-polarized light
at 3000 cm
À1 vs angle of incidence for a system composed of air|SiO 2 |Au at the Au|SiO 2 interface
for the following thicknesses of the silicate film: 0, 4, 7, 40, 90 and 120 nm. Inset: MSEFS of the
electric field vector of the x-component (in plane) of the p-polarized light at 3000 cm
À1 vs incident
angle at the same interface with SiO 2 thickness: 7 (dotted line) and 120 nm (full line)
22
2 Polarization Modulation Infrared Reflection Absorption Spectroscopy: From. . .
(Fig. 2.9a) and a soft-matter film (Fig. 2.9b). This modification of the metal surface
changes the surface properties but maintains high reflectivity of metallic surfaces.
Deposition of thin films (thickness < 100 nm) of these materials on an IR
reflecting metal surface (e.g. gold) ensures the fulfillment of the surface selection
rule of IRRAS. Figure 2.10 shows MSEFS versus angle of incidence plots of the Au
surface and Au surface modified by silicon oxide films of different thickness [17]. A
modification of the Au surface with a thinner than 90 nm silica film gives ca. 3.5
times enhancement of the MSEFS on the metal surface (Fig. 2.10) [17]. These
substrates can be applied in IRRAS.
For the application in IRRAS, the thickness of titanium deposited on the Au
surface should not exceed 50 nm [42]. Silicate and titanium modified Au surfaces
were applied to study the composition, orientation and packing of lipid bialyers
[17, 42, 45] as well as self-assembled monolayers [43].
Fig. 2.9 Modification of the metal surface with (a) a thin inorganic oxide layer, (b) thin polymer
film for studies of organized molecular films by means of in situ IRRAS
0
2 0
4 0
6 0
8 0
0
1
2
3
4
0
2 0
4 0
6 0
8 0
0.00
0.05
0.10
0.15
0.20
0.25
MSEFS
i
/ degree
SiO 2 layer
thickness increase
MESFS
i
/ degree
Fig. 2.10 MSEFS of the electric field vector of the z-component (vertical) of the p-polarized light
at 3000 cm
À1 vs angle of incidence for a system composed of air|SiO 2 |Au at the Au|SiO 2 interface
for the following thicknesses of the silicate film: 0, 4, 7, 40, 90 and 120 nm. Inset: MSEFS of the
electric field vector of the x-component (in plane) of the p-polarized light at 3000 cm
À1 vs incident
angle at the same interface with SiO 2 thickness: 7 (dotted line) and 120 nm (full line)
22
2 Polarization Modulation Infrared Reflection Absorption Spectroscopy: From. . .