14 Label-Free Super-Resolution Imaging with Hyperbolic Materials
367
References
1. M. Born, E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference
and Diffraction of Light, 7th edn. (Cambridge University Press, Cambridge, 1999)
2. A. Sakdinawat, D. Attwood, Nanoscale x-ray imaging. Nat. Photonics 4(12), 840–848 (2010)
3. J. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig Jr., C.E. Lyman, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials
Scientists, and Geologists (Springer Science & Business Media, New York, 2012)
4. A. Pliss, A.N. Kuzmin, A.V. Kachynski, P.N. Prasad, Nonlinear optical imaging and Raman
microspectrometry of the cell nucleus throughout the cell cycle. Biophys. J. 99(10), 3483–3491
(2010)
5. S.W. Hell, J. Wichmann, Breaking the diffraction resolution limit by stimulated emission:
stimulated-emission-depletion fluorescence microscopy. Opt. Lett. 19(11), 780–782 (1994)
6. M.G. Gustafsson, Surpassing the lateral resolution limit by a factor of two using structured
illumination microscopy. J. Microsc. 198(2), 82–87 (2000)
7. E. Betzig, J. Trautman, T. Harris, J. Weiner, R. Kostelak, Breaking the diffraction barrier:
optical microscopy on a nanometric scale. Science 251(5000), 1468–1470 (1991)
8. E. Synge, Xxxviii. a suggested method for extending microscopic resolution into the ultramicroscopic region. Lond. Edinb. Dublin Philos. Mag. 6(35), 356–362 (1928)
9. B. Hecht, B. Sick, U.P. Wild, V. Deckert, R. Zenobi, O.J. Martin, D.W. Pohl, Scanning nearfield optical microscopy with aperture probes: fundamentals and applications. J. Chem. Phys.
112(18), 7761–7774 (2000)
10. L. Novotny, Principles of Nano-Optics (Cambridge University Press, Cambridge, 2012)
11. A. Jost, R. Heintzmann, Superresolution multidimensional imaging with structured illumination microscopy. Annu. Rev. Mater. Sci. 43, 261–282 (2013)
12. S. Haykin, Communication Systems (Wiley, New York, 2008)
13. S. Borman, R. Stevenson, Spatial resolution enhancement of low-resolution image sequences
- a comprehensive review with directions for future research. Technical report, Laboratory for
Image and Signal Analysis, University of Notre Dame (1998)
14. E.J. Candès, J. Romberg, T. Tao, Robust uncertainty principles: exact signal reconstruction from
highly incomplete frequency information. IEEE Trans. Inf. Theory 52(2), 489–509 (2006)
15. S. Gazit, A. Szameit, Y.C. Eldar, M. Segev, Super-resolution and reconstruction of sparse
sub-wavelength images. Opt. Express 17(26), 23920–23946 (2009)
16. Y. Shechtman, Y.C. Eldar, A. Szameit, M. Segev, Sparsity based sub-wavelength imaging with
partially incoherent light via quadratic compressed sensing. Opt. Express 19(16), 14807–14822
(2011)
17. J.-I. Hotta, E. Fron, P. Dedecker, K.P. Janssen, C. Li, K. Mullen, B. Harke, J. Buckers, S.W. Hell,
J. Hofkens, Spectroscopic rationale for efficient stimulated-emission depletion microscopy
fluorophores. J. Am. Chem. Soc. 132(14), 5021–5023 (2010)
18. M.J. Rust, M. Bates, X. Zhuang, Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM). Nat. Methods 3(10), 793 (2006)
19. D. Kamiyama, B. Huang, Development in the storm. Dev. Cell 23(6), 1103–1110 (2012)
20. W. Cai, V. Shalaev, Optical Metamaterials: Fundamentals and Applications (Springer Science
& Business Media, New York, 2009)
21. V.G. Veselago, The electrodynamics of substances with simultaneously negative values of
and μ. Phys.-Uspekhi 10(4), 509 (1968)
22. J.B. Pendry, Negative refraction makes a perfect lens. Phys. Rev. Lett. 85(18), 3966–3969
(2000)
23. J.B. Pendry, Left-handed materials do not make a perfect lens. Phys. Rev. Lett. 91(9), 099701
(2003)
24. R. Merlin, Analytical solution of the almost-perfect-lens problem. Appl. Phys. Lett. 84(8),
1290–1292 (2004)
25. V.A. Podolskiy, E.E. Narimanov, Near-sighted superlens. Opt. Lett. 30(1), 75–77 (2005)
367
References
1. M. Born, E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference
and Diffraction of Light, 7th edn. (Cambridge University Press, Cambridge, 1999)
2. A. Sakdinawat, D. Attwood, Nanoscale x-ray imaging. Nat. Photonics 4(12), 840–848 (2010)
3. J. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig Jr., C.E. Lyman, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials
Scientists, and Geologists (Springer Science & Business Media, New York, 2012)
4. A. Pliss, A.N. Kuzmin, A.V. Kachynski, P.N. Prasad, Nonlinear optical imaging and Raman
microspectrometry of the cell nucleus throughout the cell cycle. Biophys. J. 99(10), 3483–3491
(2010)
5. S.W. Hell, J. Wichmann, Breaking the diffraction resolution limit by stimulated emission:
stimulated-emission-depletion fluorescence microscopy. Opt. Lett. 19(11), 780–782 (1994)
6. M.G. Gustafsson, Surpassing the lateral resolution limit by a factor of two using structured
illumination microscopy. J. Microsc. 198(2), 82–87 (2000)
7. E. Betzig, J. Trautman, T. Harris, J. Weiner, R. Kostelak, Breaking the diffraction barrier:
optical microscopy on a nanometric scale. Science 251(5000), 1468–1470 (1991)
8. E. Synge, Xxxviii. a suggested method for extending microscopic resolution into the ultramicroscopic region. Lond. Edinb. Dublin Philos. Mag. 6(35), 356–362 (1928)
9. B. Hecht, B. Sick, U.P. Wild, V. Deckert, R. Zenobi, O.J. Martin, D.W. Pohl, Scanning nearfield optical microscopy with aperture probes: fundamentals and applications. J. Chem. Phys.
112(18), 7761–7774 (2000)
10. L. Novotny, Principles of Nano-Optics (Cambridge University Press, Cambridge, 2012)
11. A. Jost, R. Heintzmann, Superresolution multidimensional imaging with structured illumination microscopy. Annu. Rev. Mater. Sci. 43, 261–282 (2013)
12. S. Haykin, Communication Systems (Wiley, New York, 2008)
13. S. Borman, R. Stevenson, Spatial resolution enhancement of low-resolution image sequences
- a comprehensive review with directions for future research. Technical report, Laboratory for
Image and Signal Analysis, University of Notre Dame (1998)
14. E.J. Candès, J. Romberg, T. Tao, Robust uncertainty principles: exact signal reconstruction from
highly incomplete frequency information. IEEE Trans. Inf. Theory 52(2), 489–509 (2006)
15. S. Gazit, A. Szameit, Y.C. Eldar, M. Segev, Super-resolution and reconstruction of sparse
sub-wavelength images. Opt. Express 17(26), 23920–23946 (2009)
16. Y. Shechtman, Y.C. Eldar, A. Szameit, M. Segev, Sparsity based sub-wavelength imaging with
partially incoherent light via quadratic compressed sensing. Opt. Express 19(16), 14807–14822
(2011)
17. J.-I. Hotta, E. Fron, P. Dedecker, K.P. Janssen, C. Li, K. Mullen, B. Harke, J. Buckers, S.W. Hell,
J. Hofkens, Spectroscopic rationale for efficient stimulated-emission depletion microscopy
fluorophores. J. Am. Chem. Soc. 132(14), 5021–5023 (2010)
18. M.J. Rust, M. Bates, X. Zhuang, Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM). Nat. Methods 3(10), 793 (2006)
19. D. Kamiyama, B. Huang, Development in the storm. Dev. Cell 23(6), 1103–1110 (2012)
20. W. Cai, V. Shalaev, Optical Metamaterials: Fundamentals and Applications (Springer Science
& Business Media, New York, 2009)
21. V.G. Veselago, The electrodynamics of substances with simultaneously negative values of
and μ. Phys.-Uspekhi 10(4), 509 (1968)
22. J.B. Pendry, Negative refraction makes a perfect lens. Phys. Rev. Lett. 85(18), 3966–3969
(2000)
23. J.B. Pendry, Left-handed materials do not make a perfect lens. Phys. Rev. Lett. 91(9), 099701
(2003)
24. R. Merlin, Analytical solution of the almost-perfect-lens problem. Appl. Phys. Lett. 84(8),
1290–1292 (2004)
25. V.A. Podolskiy, E.E. Narimanov, Near-sighted superlens. Opt. Lett. 30(1), 75–77 (2005)