7 Label-Free Pump–Probe Nanoscopy
193
92. B. Harke, J. Keller, C.K. Ullal, V. Westphal, A. Schönle, S.W. Hell, Resolution scaling in
STED microscopy. Opt. Express 16(6), 4154 (2008)
93. S.W. Hell, Microscopy and its focal switch. Nat. Methods 6(1), 24–32 (2009)
94. S.W. Hell, Toward fluorescence nanoscopy. Nat. Biotechnol. 21(11), 1347–55 (2003)
95. W. Liu, H. Niu, Diffraction barrier breakthrough in coherent anti-stokes Raman scattering
microscopy by additional probe-beam-induced phonon depletion. Phys. Rev. A At. Mol. Opt.
Phys. 83(2), 1–5 (2011)
96. C. Cleff, P. Groß, C. Fallnich, H.L. Offerhaus, J.L. Herek, K. Kruse, W.P. Beeker, C.J. Lee,
K.J. Boller, Stimulated-emission pumping enabling sub-diffraction-limited spatial resolution
in coherent anti-Stokes Raman scattering microscopy. Phys. Rev. A At. Mol. Opt. Phys. 87(3),
1–9 (2013)
97. C. Cleff, P. Groß, C. Fallnich, H.L. Offerhaus, J.L. Herek, K. Kruse, W.P. Beeker, C.J. Lee,
K.-J. Boller, Ground-state depletion for subdiffraction-limited spatial resolution in coherent
anti-Stokes Raman scattering microscopy. Phys. Rev. A 86(2), 023825 (2012)
98. W.R. Silva, C.T. Graefe, R.R. Frontiera, Toward label-free super-resolution microscopy. ACS
Photonics 3(1), 79–86 (2016)
99. D. Kim, D.S. Choi, J. Kwon, S.-H. Shim, H. Rhee, M. Cho, Selective suppression of stimulated
Raman scattering with another competing stimulated Raman scattering. J. Phys. Chem. Lett.,
6118–6123 (2017)
100. P. Wang, M.N. Slipchenko, J. Mitchell, C. Yang, E.O. Potma, X. Xu, J.-X.X. Cheng, Farfield imaging of non-fluorescent species with subdiffraction resolution. Nat. Photonics 7(6),
449–453 (2013)
101. C. Silien, N. Liu, N. Hendaoui, S.A.M. Tofail, A. Peremans, A framework for far-field infrared
absorption microscopy beyond the diffraction limit. Opt. Express 20(28), 29694–704 (2012)
102. I. Pita, N. Hendaoui, N. Liu, M. Kumbham, S.A.M. Tofail, A. Peremans, C. Silien, High
resolution imaging with differential infrared absorption micro-spectroscopy. Opt. Express
21(22), 25632 (2013)
103. S. Galiani, B. Harke, G. Vicidomini, G. Lignani, F. Benfenati, A. Diaspro, P. Bianchini,
Strategies to maximize the performance of a STED microscope. Opt. Express 20(7), 7362
(2012)
104. E.S. Massaro, A.H. Hill, E.M. Grumstrup, Super-resolution structured pump-probe
microscopy. ACS Photonics 3(4), 501–506 (2016)
105. H. Dehez, M. Piché, Y. De Koninck, Resolution and contrast enhancement in laser scanning
microscopy using dark beam imaging. Opt. Express 21(13), 15912 (2013)
106. S. You, C. Kuang, Z. Rong, X. Liu, Eliminating deformations in fluorescence emission difference microscopy. Opt. Express 22(21), 26375 (2014)
107. K. Korobchevskaya, C. Peres, Z. Li, A. Antipov, C.J.R. Sheppard, A. Diaspro, P. Bianchini, Intensity weighted subtraction microscopy approach for image contrast and resolution
enhancement. Sci. Rep. 6(April), 25816 (2016)
108. N. Liu, M. Kumbham, I. Pita, Y. Guo, P. Bianchini, A. Diaspro, S.A.M. Tofail, A. Peremans, C. Silien, Far-field subdiffraction imaging of semiconductors using nonlinear transient
absorption differential microscopy. ACS Photonics 3(3), 478–485 (2016)
193
92. B. Harke, J. Keller, C.K. Ullal, V. Westphal, A. Schönle, S.W. Hell, Resolution scaling in
STED microscopy. Opt. Express 16(6), 4154 (2008)
93. S.W. Hell, Microscopy and its focal switch. Nat. Methods 6(1), 24–32 (2009)
94. S.W. Hell, Toward fluorescence nanoscopy. Nat. Biotechnol. 21(11), 1347–55 (2003)
95. W. Liu, H. Niu, Diffraction barrier breakthrough in coherent anti-stokes Raman scattering
microscopy by additional probe-beam-induced phonon depletion. Phys. Rev. A At. Mol. Opt.
Phys. 83(2), 1–5 (2011)
96. C. Cleff, P. Groß, C. Fallnich, H.L. Offerhaus, J.L. Herek, K. Kruse, W.P. Beeker, C.J. Lee,
K.J. Boller, Stimulated-emission pumping enabling sub-diffraction-limited spatial resolution
in coherent anti-Stokes Raman scattering microscopy. Phys. Rev. A At. Mol. Opt. Phys. 87(3),
1–9 (2013)
97. C. Cleff, P. Groß, C. Fallnich, H.L. Offerhaus, J.L. Herek, K. Kruse, W.P. Beeker, C.J. Lee,
K.-J. Boller, Ground-state depletion for subdiffraction-limited spatial resolution in coherent
anti-Stokes Raman scattering microscopy. Phys. Rev. A 86(2), 023825 (2012)
98. W.R. Silva, C.T. Graefe, R.R. Frontiera, Toward label-free super-resolution microscopy. ACS
Photonics 3(1), 79–86 (2016)
99. D. Kim, D.S. Choi, J. Kwon, S.-H. Shim, H. Rhee, M. Cho, Selective suppression of stimulated
Raman scattering with another competing stimulated Raman scattering. J. Phys. Chem. Lett.,
6118–6123 (2017)
100. P. Wang, M.N. Slipchenko, J. Mitchell, C. Yang, E.O. Potma, X. Xu, J.-X.X. Cheng, Farfield imaging of non-fluorescent species with subdiffraction resolution. Nat. Photonics 7(6),
449–453 (2013)
101. C. Silien, N. Liu, N. Hendaoui, S.A.M. Tofail, A. Peremans, A framework for far-field infrared
absorption microscopy beyond the diffraction limit. Opt. Express 20(28), 29694–704 (2012)
102. I. Pita, N. Hendaoui, N. Liu, M. Kumbham, S.A.M. Tofail, A. Peremans, C. Silien, High
resolution imaging with differential infrared absorption micro-spectroscopy. Opt. Express
21(22), 25632 (2013)
103. S. Galiani, B. Harke, G. Vicidomini, G. Lignani, F. Benfenati, A. Diaspro, P. Bianchini,
Strategies to maximize the performance of a STED microscope. Opt. Express 20(7), 7362
(2012)
104. E.S. Massaro, A.H. Hill, E.M. Grumstrup, Super-resolution structured pump-probe
microscopy. ACS Photonics 3(4), 501–506 (2016)
105. H. Dehez, M. Piché, Y. De Koninck, Resolution and contrast enhancement in laser scanning
microscopy using dark beam imaging. Opt. Express 21(13), 15912 (2013)
106. S. You, C. Kuang, Z. Rong, X. Liu, Eliminating deformations in fluorescence emission difference microscopy. Opt. Express 22(21), 26375 (2014)
107. K. Korobchevskaya, C. Peres, Z. Li, A. Antipov, C.J.R. Sheppard, A. Diaspro, P. Bianchini, Intensity weighted subtraction microscopy approach for image contrast and resolution
enhancement. Sci. Rep. 6(April), 25816 (2016)
108. N. Liu, M. Kumbham, I. Pita, Y. Guo, P. Bianchini, A. Diaspro, S.A.M. Tofail, A. Peremans, C. Silien, Far-field subdiffraction imaging of semiconductors using nonlinear transient
absorption differential microscopy. ACS Photonics 3(3), 478–485 (2016)