Visionneuse

Date_TXT

Singapore: Springer, 2021

Auteur

Yan Li, Deepak Goyal

Sujet

3D microelectronic packages; Advanced materials in 3D packages; Failure analysis microelectronic packaging; Heat dissipation; Metallic and polymeric packaging materials; Micro bumps

Type de document

Livre

Description :

This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development.