1
,
'
_
502
'
INDEX
,
‘
X-rays (Conf.)
X—rays (Conf.)
'
—
crystal analysis,’ZOS—ZIO
——
refraction of, 204, 213
——
exper.,
216
-—
scattering process, 203, 201, 212
——
powder method, 58
—
selective reection of, 54
—
di_Eraction of, 205, 54, 53
——
soft, 194
_
—
discovery, 191
——
spectra, 192, 207
'
—
drop—tracks of, 440 (281)
—
spectrometers, 205—210
—
emission of, 211, 192
——
exper., 218
—
energy diagram, 211
——
powder method, 58
'—expansion chamber for, 434, 197
-—
table, 469
—
exposure curve, 196
—track of beam, 440, (281)
—
lter for, 201
——
wave—length of;
—
ne structure, 210
——
by absorption, 202
—
uorescent, 193
,
—-———
exper., 214
-—
from radioactive substances, 278
——
by crystals, 205
.
—
general radiation, 192
_
exper., 218
—hard, 194
——
by grating, 12
—
index of refraction, 204
——
effective or mean, 214
—intensity of, 196, 212, 213
——
mean, 214
——
ionization chamber for, 410, 218, 197
——
modied, 203
—
ionization by:
_
‘
.—— wave properties, 204
-
——
in ionization Chambers, 410, 198
—white radiation, 192
——
in expansion chambers,440,197 '
.
'
_
_
_,
process of, 201 5
Yield:
_
.
—1sochromat by, 220
.
——
in transformations, 309, 323, 325
-—
Lane, crystal analysis: 207
,
.
.
,
——-—
photoelectrrc, 70
,
_
exper., 216
.
—.— measurement of, 72 .
‘
—
measurement;
'
__
uantuin 79
'
..
,
,
—
——
of electron charge, 12
_
q
’
,
_
——
modied, 203
_
,
'
‘
—
—
;
; .— monochromatic, 214 (205, 218) ‘
-
Zeeman
,
«
—äphotoelectric effects, 88
,
Zeleny: 161
»
,_
,
__
204
-f —
,
,.
.
-
——
electro_scope, 389
.
-
…
of, 193—196 -
Zinc:
‘
.
_
_
'
:— blende, sulphite,
_
°
12, 53, 204
—
see screens.
?;
;
…
_…
ï
,
'
_
502
'
INDEX
,
‘
X-rays (Conf.)
X—rays (Conf.)
'
—
crystal analysis,’ZOS—ZIO
——
refraction of, 204, 213
——
exper.,
216
-—
scattering process, 203, 201, 212
——
powder method, 58
—
selective reection of, 54
—
di_Eraction of, 205, 54, 53
——
soft, 194
_
—
discovery, 191
——
spectra, 192, 207
'
—
drop—tracks of, 440 (281)
—
spectrometers, 205—210
—
emission of, 211, 192
——
exper., 218
—
energy diagram, 211
——
powder method, 58
'—expansion chamber for, 434, 197
-—
table, 469
—
exposure curve, 196
—track of beam, 440, (281)
—
lter for, 201
——
wave—length of;
—
ne structure, 210
——
by absorption, 202
—
uorescent, 193
,
—-———
exper., 214
-—
from radioactive substances, 278
——
by crystals, 205
.
—
general radiation, 192
_
exper., 218
—hard, 194
——
by grating, 12
—
index of refraction, 204
——
effective or mean, 214
—intensity of, 196, 212, 213
——
mean, 214
——
ionization chamber for, 410, 218, 197
——
modied, 203
—
ionization by:
_
‘
.—— wave properties, 204
-
——
in ionization Chambers, 410, 198
—white radiation, 192
——
in expansion chambers,440,197 '
.
'
_
_
_,
process of, 201 5
Yield:
_
.
—1sochromat by, 220
.
——
in transformations, 309, 323, 325
-—
Lane, crystal analysis: 207
,
.
.
,
——-—
photoelectrrc, 70
,
_
exper., 216
.
—.— measurement of, 72 .
‘
—
measurement;
'
__
uantuin 79
'
..
,
,
—
——
of electron charge, 12
_
q
’
,
_
——
modied, 203
_
,
'
‘
—
—
;
; .— monochromatic, 214 (205, 218) ‘
-
Zeeman
,
«
—äphotoelectric effects, 88
,
Zeleny: 161
»
,_
,
__
204
-f —
,
,.
.
-
——
electro_scope, 389
.
-
…
of, 193—196 -
Zinc:
‘
.
_
_
'
:— blende, sulphite,
_
°
12, 53, 204
—
see screens.
?;
;
…
_…
ï
