Index
263
Scanning near-field optical microscopy
(SNOM), xxxi, 134, 138, 243
Scattering-type, xxxi, 40, 41, 138–140,
142
Scanning-probe techniques, 135
Scanning transmission electron microscopy
(STEM), xxxi, 134
Scanning tunneling microscopy (STM),
xxxi, 134
Second-harmonic generation (SHG), xxxi,
8, 141, 147, 162, 164–167
Second-order temporal autocorrelation
function, xxxiii, 21, 83, 84, 101, 105,
111, 112, 114, 118, 149, 150, 176
Self-mode-locking, 163, 200, 232, 234–236
Semiconductor
II/VI, xxix
III/V, xxix, 2, 6, 77, 79, 113, 148
organic, 2
Semiconductor disk laser (SDL), 200
Semiconductor optics, 71, 100, 198, 229
Semiconductor saturable-absorber mirror
(SESAM), xxxi, 104, 105, 199, 235
Shadow mask, 215, 223
SHG mapping, 141
Single-photon counting, see Time-correlated
single-photon counting (TCSPC)
Single-photon source (SPS), xxxi, 2, 3, 5, 11,
12, 62, 64, 112, 113, 165, 200, 230,
232
electrically-driven, 12
high-repetition rate, 115, 234
quantum-dot, 12, 112, 113, 201, 234
quantum-dot–microlens, 115
room-temperature, 12
Solar cell, 6, 7, 231, 242–244
organic, 6
Sommerfeld’s constant, see Fine-structure
constant
Spatial distribution, 138
Spatial selection
confocal, 137
micrometer-precise, 137
Spectroscopy, 133–136
angle-resolved, 155, 172
fluorescence, 138
Fourier-space, 155, 169, 170
laser, 175
linear, 161
luminescence, 138, 153, 159
micro, 137
momentum-space-resolved, see Fourierspace spectroscopy
nonlinear, 152, 153
optical pump-probe, 148
photocurrent, 158
PL-excitation, 153
Raman, 138
reflection, 148
reflection-contrast, 152
spatially-integrated, 138
steady-state, 152, 153
terahertz, 173
time-averaged, 153, 155
time-integrated, 144
time-resolved, 143, 144, 155
white-light, 152, 153
Speed of light, xxxii
Spin-Meissner effect, 81, 83, 176
Spinor condensate, 83, 84, 108, 110, 117,
118, 176
Spintronic, 7, 9, 38
Spontaneous emission (SE), xxxi, 40, 43, 61,
62, 67, 101
Spontaneous parametric down conversion
(SPDC), xxxi, 101
Sputtering, 215
Stacking type, 160
Stimulated emission, 68, 101, 108, 153, 192,
198, 201
Stimulated scattering, 63, 108, 196, 201, 244
Stokes lines, 159
Anti-, 159
Stop band, 194
Strain, 29
Stranski–Krastanov epitaxy mode, 114
Streak-camera technique, 143–145
Strong coupling, 65, 108, 110, 112, 116–118,
148, 244, 245
SU-8, xxxi, 169
Subband, 26, 193
Sum-frequency generation (SFG), xxxi, 147,
162, 165
Superconductivity, 196
Superfluidity, 32, 63, 69, 71, 72, 81–83, 110,
196, 201, 202, 232, 236, 237
Superlattice, 7, 9, 20, 34, 36, 193, 199, 238,
242
Superposition, 2, 9, 65, 76, 78, 80, 236
Susceptibility, 151, 161
nonlinear, 162
second-order, 165
T
TECSEL, see THz-generating VECSEL
263
Scanning near-field optical microscopy
(SNOM), xxxi, 134, 138, 243
Scattering-type, xxxi, 40, 41, 138–140,
142
Scanning-probe techniques, 135
Scanning transmission electron microscopy
(STEM), xxxi, 134
Scanning tunneling microscopy (STM),
xxxi, 134
Second-harmonic generation (SHG), xxxi,
8, 141, 147, 162, 164–167
Second-order temporal autocorrelation
function, xxxiii, 21, 83, 84, 101, 105,
111, 112, 114, 118, 149, 150, 176
Self-mode-locking, 163, 200, 232, 234–236
Semiconductor
II/VI, xxix
III/V, xxix, 2, 6, 77, 79, 113, 148
organic, 2
Semiconductor disk laser (SDL), 200
Semiconductor optics, 71, 100, 198, 229
Semiconductor saturable-absorber mirror
(SESAM), xxxi, 104, 105, 199, 235
Shadow mask, 215, 223
SHG mapping, 141
Single-photon counting, see Time-correlated
single-photon counting (TCSPC)
Single-photon source (SPS), xxxi, 2, 3, 5, 11,
12, 62, 64, 112, 113, 165, 200, 230,
232
electrically-driven, 12
high-repetition rate, 115, 234
quantum-dot, 12, 112, 113, 201, 234
quantum-dot–microlens, 115
room-temperature, 12
Solar cell, 6, 7, 231, 242–244
organic, 6
Sommerfeld’s constant, see Fine-structure
constant
Spatial distribution, 138
Spatial selection
confocal, 137
micrometer-precise, 137
Spectroscopy, 133–136
angle-resolved, 155, 172
fluorescence, 138
Fourier-space, 155, 169, 170
laser, 175
linear, 161
luminescence, 138, 153, 159
micro, 137
momentum-space-resolved, see Fourierspace spectroscopy
nonlinear, 152, 153
optical pump-probe, 148
photocurrent, 158
PL-excitation, 153
Raman, 138
reflection, 148
reflection-contrast, 152
spatially-integrated, 138
steady-state, 152, 153
terahertz, 173
time-averaged, 153, 155
time-integrated, 144
time-resolved, 143, 144, 155
white-light, 152, 153
Speed of light, xxxii
Spin-Meissner effect, 81, 83, 176
Spinor condensate, 83, 84, 108, 110, 117,
118, 176
Spintronic, 7, 9, 38
Spontaneous emission (SE), xxxi, 40, 43, 61,
62, 67, 101
Spontaneous parametric down conversion
(SPDC), xxxi, 101
Sputtering, 215
Stacking type, 160
Stimulated emission, 68, 101, 108, 153, 192,
198, 201
Stimulated scattering, 63, 108, 196, 201, 244
Stokes lines, 159
Anti-, 159
Stop band, 194
Strain, 29
Stranski–Krastanov epitaxy mode, 114
Streak-camera technique, 143–145
Strong coupling, 65, 108, 110, 112, 116–118,
148, 244, 245
SU-8, xxxi, 169
Subband, 26, 193
Sum-frequency generation (SFG), xxxi, 147,
162, 165
Superconductivity, 196
Superfluidity, 32, 63, 69, 71, 72, 81–83, 110,
196, 201, 202, 232, 236, 237
Superlattice, 7, 9, 20, 34, 36, 193, 199, 238,
242
Superposition, 2, 9, 65, 76, 78, 80, 236
Susceptibility, 151, 161
nonlinear, 162
second-order, 165
T
TECSEL, see THz-generating VECSEL