632
A. Jariwala et al.
depict their disturbed surfaces as a result of slicing or surface grinding during the
manufacturing steps.
Kronik et al. have successfully demonstrated the application of SPS for quality
control of ZnO/CdS/Cu(In,Ga)Se 2 thin film solar cells [133]. They have shown that
the SPS can effectively detect “hard failures” after the CIGS deposition, and both
“hard” and “soft” failures after CdS deposition and ZnO deposition. They propose
that the in-line use of SPS after each semiconductor layer deposition can reduce the
manufacturing costs and enhances the process yields during manufacturing.
6 Conclusion
The chapter comprehensively covers various aspects of the surface photovoltage
spectroscopy (SPS) including the fundamental mechanism, theoretical framework,
experimental conditions, different variants in the experiments and a wide range of
applications. Various pros and cons of employing the SPS under different conditions
have also been discussed. The chapter also contains actual images of the experimental
setup developed at our lab and explains some of the interesting results obtained with
the help of that setup. Overall, the chapter gives an extensive overview of the SPS
technique and provides readers with a good quick reference, while designing or
performing the SPS experiments.
References
1. D. Cavalcoli, G. Impellizzeri, L. Romano, M. Miritello, M.G. Grimaldi, B. Fraboni, A.C.S.
Appl, Mater. Interfaces 7, 16992–16998 (2015)
2. V. Donchev, T. Ivanov, T. Ivanova, S. Mathews, J.O. Kim, S. Krishna, Superlattices
Microstruct. 88, 711–722 (2015)
3. Y. González, A. Abelenda, M. Sánchez, J. Phys: Conf. Ser. 792, 012021 (2017)
4. D. Cavalcoli, M.A. Fazio, Mater. Sci. Semicond. Process. 92, 28–38 (2019)
5. V. Donchev, S. Georgiev, I Leontis and A G. ACS Appl. Energy Mater. 1, 3693–3701 (2018)
6. V. Donchev, M. Milanova, I. Asenova, N. Shtinkov, D. Alonso-Álvarez, A. Mellor, Y.
Karmakov, S. Georgiev, N. Ekins-Daukes, J. Cryst. Growth 483, 140–146 (2018)
7. W.H. Brattain, J. Bardeen, Bell System Tech. J. 32, 1 (1953)
8. E.O. Johnson, Phys. Rev. 111, 153 (1958)
9. L. Kronik, Y. Shapira, Surf. Sci. Rep. 37, 1–206 (1999)
10. L. Kronik, Y. Shapira, Surf. Interface Anal. 31, 954–965 (2001)
11. D.K. Schroder, Meas. Sci. Technol. 12, R16–R31 (2001)
12. A. Many, Y. Goldstein, N.B. Grover, Semiconductor Surfaces, 2nd edn. (North-Holland,
Amsterdam, 1971)
13. J. Lagowski, P. Edelman, M. Dexter, W. Henley, Sci. Technol. 7, A185–A192 (1992)
14. G. Dumitras, H. Riechert, J. Appl. Phys. 94, 3955–3959 (2003)
15. H.C. Gatos, J.J. Lagowski, Vac. Sci. Technol. 10, 130 (1973)
16. L.J. Brillson, Surf. Sci. 51, 45 (1975)
17. Y. Shapira, L.J. Brillson, A. Heller, Phys. Rev. 29, 6824 (1984)
18. G. Heiland, W. Monch, Surf. Sci. 37, 30 (1973)
A. Jariwala et al.
depict their disturbed surfaces as a result of slicing or surface grinding during the
manufacturing steps.
Kronik et al. have successfully demonstrated the application of SPS for quality
control of ZnO/CdS/Cu(In,Ga)Se 2 thin film solar cells [133]. They have shown that
the SPS can effectively detect “hard failures” after the CIGS deposition, and both
“hard” and “soft” failures after CdS deposition and ZnO deposition. They propose
that the in-line use of SPS after each semiconductor layer deposition can reduce the
manufacturing costs and enhances the process yields during manufacturing.
6 Conclusion
The chapter comprehensively covers various aspects of the surface photovoltage
spectroscopy (SPS) including the fundamental mechanism, theoretical framework,
experimental conditions, different variants in the experiments and a wide range of
applications. Various pros and cons of employing the SPS under different conditions
have also been discussed. The chapter also contains actual images of the experimental
setup developed at our lab and explains some of the interesting results obtained with
the help of that setup. Overall, the chapter gives an extensive overview of the SPS
technique and provides readers with a good quick reference, while designing or
performing the SPS experiments.
References
1. D. Cavalcoli, G. Impellizzeri, L. Romano, M. Miritello, M.G. Grimaldi, B. Fraboni, A.C.S.
Appl, Mater. Interfaces 7, 16992–16998 (2015)
2. V. Donchev, T. Ivanov, T. Ivanova, S. Mathews, J.O. Kim, S. Krishna, Superlattices
Microstruct. 88, 711–722 (2015)
3. Y. González, A. Abelenda, M. Sánchez, J. Phys: Conf. Ser. 792, 012021 (2017)
4. D. Cavalcoli, M.A. Fazio, Mater. Sci. Semicond. Process. 92, 28–38 (2019)
5. V. Donchev, S. Georgiev, I Leontis and A G. ACS Appl. Energy Mater. 1, 3693–3701 (2018)
6. V. Donchev, M. Milanova, I. Asenova, N. Shtinkov, D. Alonso-Álvarez, A. Mellor, Y.
Karmakov, S. Georgiev, N. Ekins-Daukes, J. Cryst. Growth 483, 140–146 (2018)
7. W.H. Brattain, J. Bardeen, Bell System Tech. J. 32, 1 (1953)
8. E.O. Johnson, Phys. Rev. 111, 153 (1958)
9. L. Kronik, Y. Shapira, Surf. Sci. Rep. 37, 1–206 (1999)
10. L. Kronik, Y. Shapira, Surf. Interface Anal. 31, 954–965 (2001)
11. D.K. Schroder, Meas. Sci. Technol. 12, R16–R31 (2001)
12. A. Many, Y. Goldstein, N.B. Grover, Semiconductor Surfaces, 2nd edn. (North-Holland,
Amsterdam, 1971)
13. J. Lagowski, P. Edelman, M. Dexter, W. Henley, Sci. Technol. 7, A185–A192 (1992)
14. G. Dumitras, H. Riechert, J. Appl. Phys. 94, 3955–3959 (2003)
15. H.C. Gatos, J.J. Lagowski, Vac. Sci. Technol. 10, 130 (1973)
16. L.J. Brillson, Surf. Sci. 51, 45 (1975)
17. Y. Shapira, L.J. Brillson, A. Heller, Phys. Rev. 29, 6824 (1984)
18. G. Heiland, W. Monch, Surf. Sci. 37, 30 (1973)