Surface Photo-Voltage Spectroscopy:
A Versatile Technique to Probe
Semiconductor Materials and Devices
Akshay Jariwala, Aditi Toshniwal, and Vipul Kheraj
Abstract The Surface Photovoltage Spectroscopy (SPS) is one of the powerful
spectroscopic techniques to probe opto-electrical properties of a wide range of semiconducting materials and devices. The ability to extract a comprehensive portrayal of
the electronic structure of the semiconductor materials make it one of the highly suitable characterization techniques to probe physical, chemical, electrical and optical
properties of the materials. The SPS basically relies on measuring variations in band
bandings at the surface as well as buried interfaces on external illumination. Consequently it can be used to construct a complete band diagrams of surfaces and interfaces of semiconductor thin-films and devices. Further, it can also offer a great
deal of quantitative characterizations for bulk properties, such as bandgap, type of
conductivity, diffusion length and lifetime of minority carriers. The SPS measurements are generally contactless and non-destructive. The present chapter discusses
the potential of the SPS as a cutting-edge and yet simple technique for study of
optical and electronic properties of a wide range of complex material systems under
various conditions. The theoretical framework to understand the surface photovoltage
phenomenon is presented in detailed, followed by experimental implementations
under various configurations. The chapter also compiles a comprehensive review of
diverse applications of SPS reported for a broad spectrum of semiconductor materials
systems and devices.
Keywords Surface · Defects · Semiconductors · Spectroscopy · Thin-film ·
Photo-voltage
A. Jariwala · A. Toshniwal · V. Kheraj (B)
Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology (SVNIT),
Ichchhanath, Surat, Gujarat 395 007, India
e-mail: vk@phy.svnit.ac.in
© The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2021
D. K. Singh et al. (eds.), Modern Techniques of Spectroscopy, Progress in Optical Science
and Photonics 13, https://doi.org/10.1007/978-981-33-6084-6_22
605
A Versatile Technique to Probe
Semiconductor Materials and Devices
Akshay Jariwala, Aditi Toshniwal, and Vipul Kheraj
Abstract The Surface Photovoltage Spectroscopy (SPS) is one of the powerful
spectroscopic techniques to probe opto-electrical properties of a wide range of semiconducting materials and devices. The ability to extract a comprehensive portrayal of
the electronic structure of the semiconductor materials make it one of the highly suitable characterization techniques to probe physical, chemical, electrical and optical
properties of the materials. The SPS basically relies on measuring variations in band
bandings at the surface as well as buried interfaces on external illumination. Consequently it can be used to construct a complete band diagrams of surfaces and interfaces of semiconductor thin-films and devices. Further, it can also offer a great
deal of quantitative characterizations for bulk properties, such as bandgap, type of
conductivity, diffusion length and lifetime of minority carriers. The SPS measurements are generally contactless and non-destructive. The present chapter discusses
the potential of the SPS as a cutting-edge and yet simple technique for study of
optical and electronic properties of a wide range of complex material systems under
various conditions. The theoretical framework to understand the surface photovoltage
phenomenon is presented in detailed, followed by experimental implementations
under various configurations. The chapter also compiles a comprehensive review of
diverse applications of SPS reported for a broad spectrum of semiconductor materials
systems and devices.
Keywords Surface · Defects · Semiconductors · Spectroscopy · Thin-film ·
Photo-voltage
A. Jariwala · A. Toshniwal · V. Kheraj (B)
Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology (SVNIT),
Ichchhanath, Surat, Gujarat 395 007, India
e-mail: vk@phy.svnit.ac.in
© The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2021
D. K. Singh et al. (eds.), Modern Techniques of Spectroscopy, Progress in Optical Science
and Photonics 13, https://doi.org/10.1007/978-981-33-6084-6_22
605